CY7C1250V18-333BZC Cypress Semiconductor Corp, CY7C1250V18-333BZC Datasheet - Page 19

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CY7C1250V18-333BZC

Manufacturer Part Number
CY7C1250V18-333BZC
Description
IC SRAM 36MBIT 333MHZ 165TFBGA
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C1250V18-333BZC

Format - Memory
RAM
Memory Type
SRAM - Synchronous, DDR II
Memory Size
36M (1M x 36)
Speed
333MHz
Interface
Parallel
Voltage - Supply
1.7 V ~ 1.9 V
Operating Temperature
0°C ~ 70°C
Package / Case
165-TFBGA
Lead Free Status / RoHS Status
Contains lead / RoHS compliant by exemption

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1250V18-333BZC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Electrical Characteristics
Over the Operating Range
DC Electrical Characteristics
Capacitance
Tested initially and after any design or process change that may affect these parameters.
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
Note
Document Number: 001-06348 Rev. *E
I
AC Input Requirements
Over the Operating Range
V
V
C
C
C
20. Unless otherwise noted, test conditions assume signal transition time of 2V/ns, timing reference levels of 0.75V, V
SB1
Parameter
Parameter
Parameter
Parameter
IH
IL
IN
CLK
O
levels of 0.25V to 1.25V, and output loading of the specified I
Θ
Θ
OUTPUT
Device
Under
Test
JA
JC
V
REF
ZQ
(a)
Automatic Power Down
Current
Input HIGH Voltage
Input LOW Voltage
Input Capacitance
Clock Input Capacitance
Output Capacitance
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Z
RQ =
250Ω
0.75V
0
= 50Ω
Description
Description
Description
Description
[12]
[11]
V
REF
R
L
= 0.75V
= 50Ω
Figure 4. AC Test Loads and Waveforms
INCLUDING
Max. V
Deselected, V
V
Inputs Static
T
V
V
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA/JESD51.
Device
Under
Test
A
OUTPUT
IN
DD
DDQ
JIG AND
= 25°C, f = 1 MHz,
SCOPE
≤ V
= 1.8V
V
OL
= 1.5V
REF
DD
IL
ZQ
/I
OH
, f = f
, Both Ports
Test Conditions
Test Conditions
and load capacitance shown in (a) of
MAX
IN
0.75V
RQ =
250Ω
(b)
≥ V
= 1/t
Test Conditions
Test Conditions
V
REF
IH
CYC
or
= 0.75V
,
R = 50Ω
5 pF
300 MHz
333 MHz
375 MHz
0.25V
AC Test Loads and
V
REF
–0.24
Min
Min
1.25V
REF
+ 0.2
Slew Rate = 2 V/ns
= 0.75V, RQ = 250Ω, V
ALL INPUT PULSES
0.75V
Waveforms.
165 FBGA
Typ.
Package
Typ
16.25
Max
2.91
5
4
5
CY7C1248V18
CY7C1250V18
V
V
DDQ
REF
DDQ
Max
Max
[20]
290
300
320
+ 0.24
= 1.5V, input pulse
– 0.2
Page 19 of 24
°C/W
°C/W
Unit
Unit
pF
pF
pF
Unit
Unit
mA
mA
mA
V
V
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