TLP181(GR-TPR,F,T) Toshiba, TLP181(GR-TPR,F,T) Datasheet - Page 62
![PHOTOCOUPLER TRANS OUT 4-SMD](/photos/7/69/76954/264-4-mfsop_sml.jpg)
TLP181(GR-TPR,F,T)
Manufacturer Part Number
TLP181(GR-TPR,F,T)
Description
PHOTOCOUPLER TRANS OUT 4-SMD
Manufacturer
Toshiba
Specifications of TLP181(GR-TPR,F,T)
Number Of Channels
1
Input Type
DC
Voltage - Isolation
3750Vrms
Current Transfer Ratio (min)
100% @ 5mA
Current Transfer Ratio (max)
300% @ 5mA
Voltage - Output
80V
Current - Output / Channel
50mA
Current - Dc Forward (if)
50mA
Vce Saturation (max)
400mV
Output Type
Transistor
Mounting Type
Surface Mount
Package / Case
4-SMD
Output Device
Transistor
Number Of Elements
1
Reverse Breakdown Voltage
5V
Forward Voltage
1.3V
Forward Current
50mA
Collector-emitter Voltage
80V
Package Type
MFSOP
Collector Current (dc) (max)
50mA
Isolation Voltage
3750Vrms
Power Dissipation
200mW
Collector-emitter Saturation Voltage
0.4V
Current Transfer Ratio
600%
Pin Count
4
Mounting
Surface Mount
Operating Temp Range
-25C to 85C
Operating Temperature Classification
Commercial
Maximum Collector Emitter Voltage
80 V
Maximum Collector Emitter Saturation Voltage
0.4 V
Maximum Forward Diode Voltage
1.3 V
Maximum Collector Current
50 mA
Maximum Power Dissipation
200 mW
Maximum Operating Temperature
+ 100 C
Minimum Operating Temperature
- 55 C
Maximum Fall Time
3 us
Maximum Input Diode Current
50 mA
Maximum Reverse Diode Voltage
5 V
Maximum Rise Time
2 us
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
TLP181GRFTR
9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
3
3
10000000
1000000
GaA As (DH) LED Projected Light Output Degradation Data
GaA As (DH) LED Projected Operating Life Data
140
120
100
140
120
100
Device Degradation
100000
80
60
40
20
80
60
40
20
10000
0
0
1000
1
1
100
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
F
F
F
F
F
150
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
Test conditions: I
Test conditions: I
100
85
3.0
60
100
100
Test time (h)
Test time (h)
F
F
25
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
1000
1000
0
4.0
I
F
Ambient Temperature (°C)
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F50%
operating life
10000
10000
Projected F0.1%
operating life
X-3σ
–50
X-3σ
1 / K(×10
X
X
100000
100000
–73
5.0
−3
)
62
10000000
1000000
140
120
100
100000
80
60
40
20
10000
0
1000
100
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
Test conditions: I
100
85
3.0
60
100
Test time (h)
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
Ambient Temperature (°C)
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
X
1 / K(×10
100000
–73
5.0
−3
)