TLP181 Toshiba, TLP181 Datasheet - Page 61
TLP181
Manufacturer Part Number
TLP181
Description
PHOTOCOUPLER TRANS-OUT 4-SMD
Manufacturer
Toshiba
Specifications of TLP181
Number Of Channels
1
Input Type
DC
Voltage - Isolation
3750Vrms
Current Transfer Ratio (min)
50% @ 5mA
Current Transfer Ratio (max)
600% @ 5mA
Voltage - Output
80V
Current - Output / Channel
50mA
Current - Dc Forward (if)
50mA
Vce Saturation (max)
400mV
Output Type
Transistor
Mounting Type
Surface Mount
Package / Case
4-SMD
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
TLP181
Manufacturer:
TOSHIBA
Quantity:
1 500
Company:
Part Number:
TLP181
Manufacturer:
TOSHIBA
Quantity:
184
Part Number:
TLP181
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
Part Number:
TLP181 GR
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
Part Number:
TLP181(BL
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
Part Number:
TLP181(BL-TPL
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
Part Number:
TLP181(BL-TPL)
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
Company:
Part Number:
TLP181(F)
Manufacturer:
TOSHIBA
Quantity:
1 467
Company:
Part Number:
TLP181(GB-TPL
Manufacturer:
TOS
Quantity:
6 022
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
2
2
10000000
1000000
100000
140
120
100
140
120
100
10000
GaA As (SH) LED Projected Operating Life Data
GaA As (SH) LED Projected Light Output Degradation Data
80
60
40
20
80
60
40
20
1000
0
0
100
1
1
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
X-3σ
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
1 / K (x10
X
X
–73
100000
100000
5.0
-3
)
61
10000000
1000000
100000
140
120
100
10000
80
60
40
20
1000
0
100
1
227
2.0
Failure criteria light output degradation Δ P O < –30%
I
I
I
I
I
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
–30
F
F
F
F
F
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
1 / K (x10
X
–73
100000
5.0
-3
)