MC9S08FL8CBM Freescale Semiconductor, MC9S08FL8CBM Datasheet - Page 27

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MC9S08FL8CBM

Manufacturer Part Number
MC9S08FL8CBM
Description
MCU 8BIT 8K FLASH 32-SDIP
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet

Specifications of MC9S08FL8CBM

Core Processor
HCS08
Core Size
8-Bit
Speed
20MHz
Connectivity
SCI
Peripherals
LVD, PWM, WDT
Number Of I /o
30
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
768 x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Data Converters
A/D 12x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
32-SDIP (0.400", 10.16mm)
Processor Series
S08FL
Core
HCS08
Data Bus Width
8 bit
Data Ram Size
768 B
Interface Type
SCI
Maximum Clock Frequency
20 MHz
Number Of Programmable I/os
30
Number Of Timers
1
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
EWS08
Development Tools By Supplier
DEMO9S08FL16
Minimum Operating Temperature
- 40 C
On-chip Adc
12-ch x 8-bit
Controller Family/series
HCS08
No. Of I/o's
30
Ram Memory Size
768Byte
Cpu Speed
20MHz
No. Of Timers
1
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MC9S08FL8CBM
Manufacturer:
Freescale Semiconductor
Quantity:
135
Part Number:
MC9S08FL8CBM
0
1
5.12
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
5.12.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (the North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
6
This section contains ordering information for MC9S08FL16 series devices. See below for an example of
the device numbering system.
Freescale Semiconductor
Radiated emissions,
electric field
Data based on qualification test results.
5
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25C using the Arrhenius equation. For additional information on how Freescale defines typical data retention,
please refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
Parameter
EMC Performance
Ordering Information
Radiated Emissions
Device Number
MC9S08FL16
MC9S08FL8
V
Symbol
RE_TEM
Table 15. Radiated Emissions, Electric Field
1
Table 16. Device Numbering System
MC9S08FL16 Series Data Sheet, Rev. 3
package type
32-pin LQFP
V
Conditions
T
FLASH
16 KB
DD
A
8 KB
= 25
= 5.0 V
Memory
C
500 – 1000 MHz
150 – 500 MHz
0.15 – 50 MHz
50 – 150 MHz
RAM
1024
Frequency
SAE Level
768
IEC Level
Available Packages
4 MHz crystal
19 MHz bus
f
OSC
32 LQFP
32 SDIP
/f
BUS
2
Ordering Information
Level
(Max)
N
9
5
2
1
1
1
dBV
Unit
27

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