PK40N512VMD100 Freescale Semiconductor, PK40N512VMD100 Datasheet - Page 51

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PK40N512VMD100

Manufacturer Part Number
PK40N512VMD100
Description
IC ARM CORTEX MCU 512K 144-MAP
Manufacturer
Freescale Semiconductor
Series
Kinetisr
Datasheets

Specifications of PK40N512VMD100

Core Processor
ARM Cortex-M4
Core Size
32-Bit
Speed
100MHz
Connectivity
CAN, EBI/EMI, I²C, IrDA, SDHC, SPI, UART/USART, USB, USB OTG
Peripherals
DMA, I²S, LCD, LVD, POR, PWM, WDT
Number Of I /o
98
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
128K x 8
Voltage - Supply (vcc/vdd)
1.71 V ~ 3.6 V
Data Converters
A/D 33x16b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 105°C
Package / Case
144-LBGA
Rohs Compliant
Yes
Processor Series
Kinetis
Core
ARM Cortex M4
Data Ram Size
128 KB
Interface Type
UART, SPI, I2C, I2S, CAN
Maximum Clock Frequency
100 MHz
Number Of Programmable I/os
98
Operating Supply Voltage
1.71 V to 3.6 V
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
PK40N512VMD100
Manufacturer:
FSL
Quantity:
185
Part Number:
PK40N512VMD100
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
6.6.3.2 12-bit DAC operating behaviors
1. Settling within ±1 LSB
2. The INL is measured for 0+100mV to V
3. The DNL is measured for 0+100 mV to V
4. The DNL is measured for 0+100mV to V
Freescale Semiconductor, Inc.
I
I
DDA_DACLP
t
t
DDA_DACH
V
Symbol
CCDACHP
V
CCDACLP
V
t
t
PSRR
DACHP
DACLP
OFFSET
dacouth
DNL
DNL
Rop
dacoutl
T
T
INL
BW
SR
E
CT
A
P
CO
GE
G
C
Supply current — low-power mode
Supply current — high-speed mode
Full-scale settling time (0x080 to 0xF7F) — low-
power mode
Full-scale settling time (0x080 to 0xF7F) — high-
power mode
Code-to-code settling time (0xBF8 to 0xC08) —
low-power mode
Code-to-code settling time (0xBF8 to 0xC08) —
high-speed mode
DAC output voltage range low — high-speed
mode, no load, DAC set to 0x000
DAC output voltage range high — high-speed
mode, no load, DAC set to 0xFFF
Integral non-linearity error — high speed mode
Differential non-linearity error — V
Differential non-linearity error — V
VREFO (1.15 V)
Offset error
Gain error
Power supply rejection ratio, V
Temperature coefficient offset voltage
Temperature coefficient gain error
Offset aging coefficient
Output resistance load = 3 kΩ
Slew rate -80h→ F7Fh→ 80h
Channel to channel cross talk
3dB bandwidth
Description
• High power (SP
• Low power (SP
• High power (SP
• Low power (SP
K40 Sub-Family Data Sheet Data Sheet, Rev. 4, 3/2011.
Table 30. 12-bit DAC operating behaviors
LP
LP
HP
HP
)
)
)
)
DACR
DDA
DACR
DACR
DACR
DACR
−100 mV
> = 2.4 V
−100 mV with V
−100 mV
> 2 V
=
Preliminary
DDA
V
−100
±0.4
±0.1
0.05
Min.
550
DACR
1.2
60
40
1
> 2.4V
Peripheral operating requirements and behaviors
TBD
TBD
TBD
0.12
Typ.
100
100
1.7
15
V
Max.
TBD
TBD
±0.8
±0.6
150
700
200
250
DACR
-80
30
±8
±1
±1
90
5
ppm of
%FSR
%FSR
FSR/C
μV/yr
μV/C
V/μs
LSB
LSB
LSB
Unit
kHz
mV
mV
μA
μA
dB
dB
μs
μs
μs
μs
Ω
Notes
1
1
1
1
2
3
4
5
5
51

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