BF512,215 NXP Semiconductors, BF512,215 Datasheet - Page 9

• Manufacturer Part Number: BF512,215
• Description: MOSFET N-CH 20V 10MA SOT23
• Manufacturer: NXP Semiconductors

Specifications of BF512,215

• Package / Case: SST3 (SOT-23-3)
• Current Rating: 30mA
• Frequency: 100MHz
• Transistor Type: N-Channel JFET
• Noise Figure: 1.5dB
• Current - Test: 5mA
• Voltage - Test: 10V
• Configuration: Single
• Mounting Style: SMD/SMT
• Transistor Polarity: N-Channel
• Drain Source Voltage Vds: 20 V
• Gate-source Cutoff Voltage: 2.2 V
• Gate-source Breakdown Voltage: 20 V
• Maximum Drain Gate Voltage: 20 V
• Continuous Drain Current: 30 mA
• Drain Current (idss At Vgs=0): 6 mA to 12 mA
• Power Dissipation: 250 mW
• Maximum Operating Temperature: + 150 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Power - Output: -
• Gain: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 933505290215::BF512 T/R::BF512 T/R

Printed in The Netherlands
© NXP B.V. 2010
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
NXP Semiconductors
Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal
definitions and disclaimers. No changes were made to the technical content, except for package outline
drawings which were updated to the latest version.
Contact information
For additional information please visit: http://www.nxp.com
For sales offices addresses send e-mail to: [e-mail]
provides High Performance Mixed Signal and Standard Product
solutions that leverage its leading RF, Analog, Power Management,
Interface, Security and Digital Processing expertise
R77/02/pp9
Date of release: December 1997