5962-8961403MXA E2V, 5962-8961403MXA Datasheet - Page 5

• Manufacturer Part Number: 5962-8961403MXA
• Manufacturer: E2V

Specifications of 5962-8961403MXA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
procedures and characteristics specified in 4.6 herein.
programmed to the specified pattern or erased. As a minimum, verification shall consist of performing a functional test
(subgroup 7) to verify that all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a
device failure, and shall be removed from the lot.
marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space
limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the
RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.
Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
listed manufacturer in order to supply to the requirements of this drawing (see 6.6 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535
and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered
to this drawing.
herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 42 (see MIL-PRF-38535, appendix A).
reprogrammability test shall be done for initial characterization and after any design or process changes which may affect the
reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of
program/erase endurance cycles listed in section 1.3 herein over the full military temperature range. The vendor's procedure
shall be kept under document control and shall be made available upon request of the acquiring or preparing activity, along with
test data.
shall be done for initial characterization and after any design or process change which may affect data retention. The methods
and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein, over the full
military temperature range. The vendor's procedure shall be kept under document control and shall be made available upon
request by the preparing or acquiring activity, along with the test data.
3.5.3 Verification of erasure of programmability of EPROM's. When specified, devices shall be verified as either
3.6 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
3.6.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
3.7 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
3.8 Certificate of conformance. A certificate of conformance as required for device classes Q and V in
3.9 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.10 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
3.12 Substitution. Substitution data shall be as indicated in appendix A herein.
3.13 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This
3.5.2 Programmability of EPROM's. When specified, devices shall be programmed to the specified pattern using the
3.11 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
3.14 Data retention.
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
STANDARD
A data retention stress test shall be completed as part of the vendor's reliability monitors. This test
SIZE
A
REVISION LEVEL
F
SHEET
5962-89614
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