ISL81487EIBZ Intersil, ISL81487EIBZ Datasheet - Page 10

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ISL81487EIBZ

Manufacturer Part Number
ISL81487EIBZ
Description
IC TXRX RS485/422 5V HS 8-SOIC
Manufacturer
Intersil
Type
Transceiverr
Datasheet

Specifications of ISL81487EIBZ

Number Of Drivers/receivers
1/1
Protocol
RS422, RS485
Voltage - Supply
4.5 V ~ 5.5 V
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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0
Human Body Model Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge stored on a 100pF capacitor through a
1.5kΩ current limiting resistor into the pin under test. The
Typical Performance Curves
-100
-120
160
140
120
100
FIGURE 6. DRIVER OUTPUT CURRENT vs DIFFERENTIAL
FIGURE 8. DRIVER OUTPUT CURRENT vs SHORT CIRCUIT
-20
-40
-60
-80
80
60
40
20
90
80
70
60
50
40
30
20
10
0
0
0
-7 -6
ISL8487E, ISL81487L
OUTPUT VOLTAGE
VOLTAGE
-4
DIFFERENTIAL OUTPUT VOLTAGE (V)
1
-2
Y OR Z = LOW
OUTPUT VOLTAGE (V)
ISL81487E
0
2
10
2
4
3
Y OR Z = HIGH
ISL8487E, ISL81487L
ISL8487E, ISL81487L, ISL81487E
6
V
Unless Otherwise Specified
CC
ISL81487E
= 5V, T
8
4
10
A
= 25°C, ISL8487E, ISL81487L and ISL81487E;
12
5
HBM method determines an IC’s ability to withstand the ESD
events typically present during handling and manufacturing.
The RS-485 pin survivability on this high ESD family has
been characterized to be in excess of ±15kV, for discharges
to GND.
FIGURE 7. DRIVER DIFFERENTIAL OUTPUT VOLTAGE vs
400
350
300
250
200
150
100
3.6
3.4
3.2
2.8
2.6
2.4
2.2
3
2
-40
-40
FIGURE 9. SUPPLY CURRENT vs TEMPERATURE
-25
-25
TEMPERATURE
ISL8487E, ISL81487L, DE = V
ISL8487E, ISL81487L, DE = GND, RE = GND
ISL81487E, DE = V
ISL81487E, DE = GND, RE = X
0
TEMPERATURE (°C)
TEMPERATURE (°C)
0
R
DIFF
25
25
CC
= 100Ω
, RE = X
CC
, RE = X
R
50
50
DIFF
February 27, 2006
= 54Ω
75
75
FN6051.7
85
85

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