FTP18N06 IPS, FTP18N06 Datasheet
FTP18N06
Related parts for FTP18N06
FTP18N06 Summary of contents
Page 1
... Figure 3 Figure 6 150 1.0 ±20 115 Figure 8 3.0 300 260 -55 to 175 Units Test Conditions Water cooled heatsink peak junction temperature of +175 cubic foot chamber, free air FTP18N06 REV. B Oct. 2006 I D 59A D S Units V/ adjusted for ...
Page 2
... mΩ Max. Units -- -- 59.6 12.6 nC 13.8 Max. Units 9 FTP18N06 REV. B Oct. 2006 Page =0V, I =250µ =250µA D =60V =48V =150 =+20V -20V GS Test Conditions =10V, I =36A GS ...
Page 3
... C unless otherwise specified J Min. Typ < =+175 C DD DSS J Max. Units Test Conditions 59 A Integral pn-diode in MOSFET 236 A I =59A =59A, di/dt=100 A/µs 135 nC F FTP18N06 REV. B Oct. 2006 Page =0V ...
Page 4
... I = 14A 28A PULSE DURATION = 250 µS 25 DUTY FACTOR = 0.5% MAX Gate-to-Source Voltage ( FTP18N06 REV. B Oct. 2006 Page θJC 1E+01 150 175 ...
Page 5
... Time in Avalanche (s) AV Typical Drain-to-Source ON Resistance vs Junction Temperature PULSE DURATION = 250 µs DUTY FACTOR = 0.5% MAX V = 10V 15A GS D -75 -50 - 100 125 150 T , Junction Temperature ( J FTP18N06 REV. B Oct. 2006 Page 150 T C – ---------------------- 125 10E+0 -V )+1] DSS ...
Page 6
... C oss ≅ rss = 0.01 0 Drain Voltage (V) DS Figure 16. Typical Body Diode Transfer Characteristics 180 160 140 120 100 0.3 0.5 0.7 0 Source-to-Drain Voltage (V) SD FTP18N06 REV. B Oct. 2006 Page 100 125 150 175 iss C oss C rss 10 100 1.1 1.3 ...
Page 7
... Figure 19. Resistive Switching Test Circuit © 2006 InPower Semiconductor Co., Ltd D.U.T. V GS(TH D.U. Miller Region Figure 18. Gate Charge Waveform 90% 10 d(ON) rise d(OFF Figure 20. Resistive Switching Waveforms FTP18N06 REV. B Oct. 2006 Page fall ...
Page 8
... InPower Semiconductor Co., Ltd. Current Pump Series Switch (MOSFET Commutating Diode Figure 24. Unclamped Inductive Switching Waveforms di/dt = 100A Figure 22. Diode Reverse Recovery Waveform FTP18N06 REV. B Oct. 2006 Page µ DSS t AV ...
Page 9
... A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system affect its safety or effectiveness. © 2006 InPower Semiconductor Co., Ltd. FTP18N06 REV. B Oct. 2006 Page ...