D63711 NEC, D63711 Datasheet - Page 36

• Manufacturer Part Number: D63711
• Description: Search -----> UPD63711
• Manufacturer: NEC

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[Functional description]
TMC:
TM[5:4]:
SOST:
GTEC:
TM[3:1]:
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Changes MIRR/DEFECT time constants to the PC2572 ratio.
Example MIRR peak/bottom/DEFECT bottom = 20 s/V/400 s/V/100 s/V
(When TM[5:4] = [0:0], TMC = 1, TM[3:1] time constants is TYP)
Of the MIRR/DEFECT time constants set using TM[3:1], changes only the DEFECT detection time
constant. Valid only when TMC is set to “1”.
Example MIRR peak/bottom/DEFECT bottom = 20 s/V/400 s/V/50 s/V
(When TM[5:4] = [0,1], TMC = 1, and TM[3:1] time constant is TYP)
Controls the offset level of the on-chip FE amplifier using CRAM 7CH.
Used in setting the TE2 signal gain. This setting can be used to set the TE2 signal gain to 3 times or 4
times that of the TE signal.
Used in setting the MIRR/DEFECT circuit peak and bottom time constants.
MIRR signal generation.............A MIRR signal is generated by superimposing RF (peak)
DEFECT signal generation .......A DEFECT signal is generated by superimposing RF bottom detection
AGC amplifier adjustment .........AGC amplifier control can be adjusted using the MIRR signal generation
The MIRR and DEFECT signals before A/D conversion can be monitored at the ATEST pin using the 37H
command.
Preliminary Product Information S14470EJ1V1PM00
detection waveform on DC 1.5 V and comparing them to a fixed value
after A/D conversion. Set an arbitrary comparator level in CRAM 5FH.
signals centered around DC 2.5 V and comparing them to a fixed value
after A/D conversion. Set an arbitrary comparator level using the 18H
command.
filter after A/D conversion. To monitor RF amplitude (G1O) stably, adjust
with the MIRR time constant (CRAM 5DH) in its the longest state.
(bottom)
PD63711