em78f644nso28s ELAN Microelectronics Corp, em78f644nso28s Datasheet - Page 200

• Manufacturer Part Number: em78f644nso28s
• Description: Flash Series 8-bit Microcontroller
• Manufacturer: ELAN Microelectronics Corp

EM78F648/644/642/641/548/544/542/541N
8-Bit Microcontroller
C Quality Assurance and Reliability
190 •
Solderability
Pre-condition
Temperature cycle
test
Pressure cooker test
High temperature /
High humidity test
High-temperature
storage life
High-temperature
operating life
Latch-up
ESD (HBM)
ESD (MM)
Test Category
C.1 Address Trap Detect
The MCU is embedded with an “Address Trap Detect” feature. It is one of fail-safe
functions that detects MCU malfunction caused by noise or the like. Whenever the
MCU attempts to fetch an instruction from a certain section of ROM, an internal
recovery circuit is auto started. If a noise-caused address error is detected, the MCU
will repeat execution of the program until the noise is eliminated. The MCU will then
continue to execute the next program.
TA=25°C, ≥ ∣± 300V∣
Solder temperature=245±5 ° C, for 5 seconds up to the
stopper using a rosin-type flux
Step 1: TCT, 65°C (15 min)~150°C (15 min), 10 cycles
Step 2: Bake at 125°C, TD (endurance)=24 hrs
Step 3: Soak at 30°C/60%，TD (endurance)=192 hrs
Step 4: IR flow 3 cycles
-65°C (15 min)~150°C (15 min), 200 cycles
TA =121°C, RH=100%, pressure=2 atm,
TD (endurance)= 96 hrs
TA=85°C , RH=85%，TD (endurance) = 168 , 500 hrs
TA=150°C, TD (endurance) = 500, 1000 hrs
TA=125°C, VCC = Max. operating voltage,
TD (endurance) = 168, 500, 1000 hrs
TA=25°C, VCC = Max. operating voltage, 150mA/20V
TA=25°C, ≥∣± 3KV∣
(Pkg thickness ≥ 2.5 mm or
Pkg volume ≥ 350 mm
(Pkg thickness ≤ 2.5 mm or
Pkg volume ≤ 350 mm
Test Conditions
3
3
(This specification is subject to change without further notice)
----225 ± 5°C)
----240 ± 5°C)
Product Specification (V1.0) 05.05.2010
VDD-VSS(+),VDD_VSS
(-) mode
IP_ND,OP_ND,IO_ND
IP_NS,OP_NS,IO_NS
IP_PD,OP_PD,IO_PD,
IP_PS,OP_PS,IO_PS,
For SMD IC (such as
SOP, QFP, SOJ, etc)
Remarks
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