HEF40175BTT NXP [NXP Semiconductors], HEF40175BTT Datasheet - Page 8

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HEF40175BTT

Manufacturer Part Number
HEF40175BTT
Description
Quad D-type flip-flop Complies with JEDEC standard JESD 13-B
Manufacturer
NXP [NXP Semiconductors]
Datasheet
NXP Semiconductors
Table 9.
HEF40175B
Product data sheet
Supply voltage
V
5 V to 15 V
Fig 6.
DD
a. Input waveforms
b. Test circuit
Test and measurement data is given in
Definitions test circuit:
DUT = Device Under Test;
R
C
Test circuit for measuring switching times
T
L
Measurement points and test data
= Load capacitance including jig and probe capacitance.
= Termination resistance should be equal to output impedance Z
Input
V
V
I
SS
negative
or V
positive
pulse
pulse
0 V
0 V
DD
V
V
I
I
All information provided in this document is subject to legal disclaimers.
G
90 %
10 %
Table 9
V
I
t
t
r
f
Rev. 7 — 3 May 2011
V
V
M
M
R T
10 %
90 %
DUT
V
DD
t
≤ 20 ns
r
, t
t
t
W
W
f
V
O
o
10 %
90 %
of the pulse generator;
C L
V
001aag182
V
M
M
t
t
r
f
001aaj781
10 %
90 %
Load
C
50 pF
L
HEF40175B
Quad D-type flip-flop
© NXP B.V. 2011. All rights reserved.
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