GS880V18BGT-200 GSI [GSI Technology], GS880V18BGT-200 Datasheet - Page 14

• Manufacturer Part Number: GS880V18BGT-200
• Description: 512K x 18, 256K x 32, 256K x 36 9Mb Sync Burst SRAMs
• Manufacturer: GSI [GSI Technology]

AC Test Conditions
DC Electrical Characteristics
Rev: 1.02 3/2005
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Notes:
1.
2.
3.
Include scope and jig capacitance.
Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
Device is deselected as defined by the Truth Table.
Output reference level
Input reference level
Output Leakage Current
Input Leakage Current
Input high level
Input slew rate
Input low level
Output High Voltage
Output Low Voltage
Parameter
(except mode pins)
FT Input Current
Output load
ZZ Input Current
Parameter
DQ
Conditions
V
Symbol
DD
V
V
V
1 V/ns
V
Fig. 1
0.2 V
I
I
I
DDQ
I
IN1
IN2
OH1
OL
OL1
DD
IL
– 0.2 V
/2
/2
* Distributed Test Jig Capacitance
Output Load 1
14/23
V
DDQ/2
Output Disable, V
I
OH
50Ω
I
OL
Test Conditions
= –4 mA, V
V
0 V ≤ V
V
0 V ≤ V
= 4 mA, V
V
DD
DD
IN
≥ V
= 0 to V
≥ V
30pF
IN
IN
IN
IN
GS880V18/32/36BT-333/300/250/200
OUT
DD
DDQ
≤ V
≥ V
≥ V
≤ V
DD
= 1.6 V
*
= 0 to V
= 1.6 V
IH
IH
IL
IL
DD
V
DDQ
–100 uA
–1 uA
–1 uA
–1 uA
–1 uA
–1 uA
© 2004, GSI Technology
Min
—
– 0.4 V
100 uA
Max
0.4 V
1 uA
1 uA
1 uA
1 uA
1 uA
—