IS62WV5128BLL-55T2I ISSI, Integrated Silicon Solution Inc, IS62WV5128BLL-55T2I Datasheet - Page 9

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IS62WV5128BLL-55T2I

Manufacturer Part Number
IS62WV5128BLL-55T2I
Description
IC SRAM 4MBIT 55NS 32TSOP
Manufacturer
ISSI, Integrated Silicon Solution Inc
Datasheet

Specifications of IS62WV5128BLL-55T2I

Format - Memory
RAM
Memory Type
SRAM - Asynchronous
Memory Size
4M (512K x 8)
Speed
55ns
Interface
Parallel
Voltage - Supply
2.5 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
32-TSOP II
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
IS62WV5128ALL,
Integrated Silicon Solution, Inc. — www.issi.com
Rev. E
01/29/08
WRITE CYCLE SWITCHING CHARACTERISTICS
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V/1.5V, input pulse levels of 0.4V to
2. The internal write time is defined by the overlap of CS1 LOW and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to
3. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
AC WAVEFORMS
WRITE CYCLE NO. 1 (CS1 Controlled, OE = HIGH or LOW)
Symbol
t
t
t
t
t
t
t
t
t
t
V
terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the write.
WC
SCS1
AW
HA
SA
PWE
SD
HD
HZWE
LZWE
DD
ADDRESS
-0.2V/V
(3)
(3)
DOUT
CS1
DIN
DD
WE
-0.3V and output loading specified in Figure 1.
Parameter
Write Cycle Time
CS1 to Write End
Address Setup Time to Write End
Address Hold from Write End
Address Setup Time
WE Pulse Width
Data Setup to Write End
Data Hold from Write End
WE LOW to High-Z Output
WE HIGH to Low-Z Output
IS62WV5128BLL
t
DATA UNDEFINED
SA
t
AW
t
HZWE
t
SCS1
t
WC
t
PWE
(1,2)
HIGH-Z
(Over Operating Range)
t
SD
DATA-IN VALID
Min.
45
45
40
25
55
0
0
5
0
55 ns
Max.
t
20
HA
t
t
LZWE
HD
Min.
70
60
60
30
50
0
0
0
5
70 ns
Max.
20
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
9

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