ISL55111IVZ Intersil, ISL55111IVZ Datasheet - Page 11

• Manufacturer Part Number: ISL55111IVZ
• Description: IC MOSFET DRIVER DUAL HS 8-TSSOP
• Manufacturer: Intersil
• Type: High Sider

Specifications of ISL55111IVZ

• Input Type: Non-Inverting
• Number Of Outputs: 2
• On-state Resistance: 3 Ohm
• Current - Output / Channel: 300mA
• Current - Peak Output: 3.5A
• Voltage - Supply: 5 V ~ 13.2 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 8-TSSOP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Typical Performance Curves Discussion
r
The r
Drive High Condition and connecting -50mA constant current
source to the Driver Output. The Voltage Drop is measured
from VH to Driver Output for r
The r
Driver Low Condition and connecting a +50mA constant
current source. The Voltage Drop from Driver Out to Ground
is measured for r
Dynamic Tests
All dynamic tests are conducted with ISL55110, ISL55111
Evaluation Board(s) (ISL55110_11EVAL2Z). Driver Loads
are soldered to the Evaluation board. Measurements are
collected with P6245 Active FET Probes and TDS5104
Oscilloscope. Pulse Stimulus is provided by HP8131 pulse
generator.
The ISL55110, ISL55111 Evaluation Boards provide Test
Point Fields for leadless connection to either an Active FET
Probe or Differential probe. TP-IN fields are used for
monitoring pulse input stimulus. TP-OA/B monitor Driver
Output waveforms. C
Driver loads. R
for User-Specified, more complex load characterization.
ON
ON
ON
Source is tested by placing the device in Constant
Sink is tested by placing the device in Constant
3
and R
ON
Calculations.
6
4
and C
are not populated and are provided
11
7
ON
are the usual placement for
calculations.
FIGURE 33. ISL55110/11EVAL2Z EVALUATION BOARD
ISL55110, ISL55111
Pin Skew
Pin Skew measurements are based on the difference in
propagation delay of the two channels. Measurements are
made on each channel from the 50% point on the stimulus
point to the 50% point on the driver output. The difference in
the propagation delay for Channel A and Channel B is
considered to be Skew.
Both Rising Propagation Delay and Falling Propagation
Delay are measured and report as tSkewR and tSkewF.
50MHz Tests
50MHz Tests reported as No Load actually include
Evaluation board parasitics and a single TEK 6545 FET
probe. However no driver load components are installed and
C
General
The Most dynamic measurements are presented in three
ways:
1. Over-temperature with a V
2. At ambient with V
3. The ambient tests are repeated with V
6
through C
2.5V, 3.5V, 4.5V and 5.50V.
data points of 3V, 6V, 9V and 12V.
9
and R
3
H
through R
set to 12V and V
DD
6
of 3.6V and V
are not populated.
DD
DD
data points of
of 3.3V and V
H
March 17, 2011
of 12.0V.
FN6228.4
H