ST72F324BK4T3 STMicroelectronics, ST72F324BK4T3 Datasheet - Page 160

• Manufacturer Part Number: ST72F324BK4T3
• Description: IC MCU 8BIT 16K FLASH 32-TQFP
• Manufacturer: STMicroelectronics
• Series: ST7r

Specifications of ST72F324BK4T3

• Core Processor: ST7
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 24
• Program Memory Size: 16KB (16K x 8)
• Program Memory Type: FLASH
• Ram Size: 512 x 8
• Voltage - Supply (vcc/vdd): 3.8 V ~ 5.5 V
• Data Converters: A/D 12x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 32-TQFP, 32-VQFP
• Processor Series: ST72F3x
• Core: ST7
• Data Bus Width: 8 bit
• Data Ram Size: 512 B
• Interface Type: SCI, SPI
• Maximum Clock Frequency: 8 MHz
• Number Of Programmable I/os: 32
• Number Of Timers: 3
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• Development Tools By Supplier: ST7232X-EVAL, ST7MDT20-DVP3, ST7MDT20J-EMU3, STX-RLINK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 12 Channel
• A/d Bit Size: 10 bit
• A/d Channels Available: 12
• Height: 1.4 mm
• Length: 7 mm
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 3.8 V
• Width: 7 mm
• For Use With: 497-6421 - BOARD EVAL DGTL BATT CHGR DESIGN497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details
• Other names: 497-8241; ST72F324BK4T3

Electrical characteristics
2. Not tested in production.
12.8.3
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Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated for standard microcontrollers: Human Body Model and Charged Device
Model. These tests conform to standards JESD22-A114 and JESD22-C101. There is an
additional model for automotive microcontrollers: Machine Model, JESD22-A115.
Table 103. Absolute maximum ratings
1. Data based on characterization results, not tested in production.
Static and dynamic Latch-Up
●
●
V
V
V
Symbol
ESD(HBM)
ESD(CDM)
ESD(MM)
LU: 3 complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
DLU: Electrostatic discharges (one positive then one negative test) are applied to each
pin of three samples when the micro is running to assess the latch-up performance in
dynamic mode. Power supplies are set to the typical values, the oscillator is connected
as near as possible to the pins of the micro and the component is put in reset mode.
This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
refer to the application note AN1181.
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(machine model)
Electrostatic discharge voltage
(charged device model)
Ratings
Doc ID13466 Rev 4
T
A
+25°C
Conditions
Maximum value
2000
200
750
ST72324B-Auto
(1)
Unit
V