STM32F103C8T6TR STMicroelectronics, STM32F103C8T6TR Datasheet - Page 41

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STM32F103C8T6TR

Manufacturer Part Number
STM32F103C8T6TR
Description
MCU ARM 64KB FLASH MEM 48-LQFP
Manufacturer
STMicroelectronics
Series
STM32r

Specifications of STM32F103C8T6TR

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
72MHz
Connectivity
CAN, I²C, IrDA, LIN, SPI, UART/USART, USB
Peripherals
DMA, Motor Control PWM, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
37
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Ram Size
20K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 10x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LQFP
For Use With
497-10048 - BOARD EVAL ACCELEROMETER497-10030 - STARTER KIT FOR STM32497-8511 - KIT STARTER FOR STM32 512K FLASH497-6438 - BOARD EVALUTION FOR STM32 512K
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

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STM32F103xx
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with SAE J
1752/3 standard which specifies the test board and the pin loading.
Table 26.
Symbol Parameter
S
EMI
Peak level
EMI characteristics
V
LQFP100 package
compliant with SAE J
1752/3
DD
Conditions
3.3 V, T
A
2 5 °C,
130 MHz to 1GHz
Frequency Band
SAE EMI Level
30 to 130 MHz
0.1 to 30 MHz
Monitored
Max vs. [f
8/48 MHz 8/72 MHz
Electrical characteristics
12
22
23
4
HSE
/f
12
19
29
HCLK
4
]
dBµV
Unit
41/67
-

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