MCF5272VF66 Freescale Semiconductor, MCF5272VF66 Datasheet - Page 482

IC MPU 32BIT 66MHZ 196-MAPBGA

MCF5272VF66

Manufacturer Part Number
MCF5272VF66
Description
IC MPU 32BIT 66MHZ 196-MAPBGA
Manufacturer
Freescale Semiconductor
Series
MCF527xr
Datasheets

Specifications of MCF5272VF66

Core Processor
Coldfire V2
Core Size
32-Bit
Speed
66MHz
Connectivity
EBI/EMI, Ethernet, I²C, SPI, UART/USART, USB
Peripherals
DMA, WDT
Number Of I /o
32
Program Memory Size
16KB (4K x 32)
Program Memory Type
ROM
Ram Size
1K x 32
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Oscillator Type
External
Operating Temperature
0°C ~ 70°C
Package / Case
196-MAPBGA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Data Converters
-

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IEEE 1149.1 Test Access Port (JTAG)
Figure 21-8
21.6
The control afforded by the output enable signals using the boundary scan register and the EXTEST
instruction requires a compatible circuit board test environment to avoid configurations that could damage
the device. The user must avoid situations in which the MCF5272 output drivers are enabled into actively
driven networks. Overdriving the TDO driver when it is active is not recommended.
21.7
In non-IEEE 1149.1 operation, IEEE 1149.1 test logic must be made transparent to system logic by forcing
the TAP controller into test-logic-reset state, which takes at least five consecutive TCK rising edges with
TMS high. TMS has an internal pull-up resistor and may be left unconnected.
If TMS is unconnected or connected to V
regardless of the TCK state. This requires the TMS, TCK, and TDI inputs to be high.
21-8
Restrictions
Non-IEEE 1149.1 Operation
shows the structure of the bypass register.
MCF5272 ColdFire
Figure 21-8. Bypass Register
®
Integrated Microprocessor User’s Manual, Rev. 3
CC
, the TAP controller cannot exit test-logic-reset state,
Freescale Semiconductor

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