F276-CEG-T-TR STMicroelectronics, F276-CEG-T-TR Datasheet - Page 187

• Manufacturer Part Number: F276-CEG-T-TR
• Description: IC MCU 16BIT 832KB FLASH 144LQFP
• Manufacturer: STMicroelectronics
• Series: ST10r

Specifications of F276-CEG-T-TR

• Core Processor: ST10
• Core Size: 16-Bit
• Speed: 48MHz
• Connectivity: ASC, CAN, EBI/EMI, I²C, SSC, UART/USART
• Peripherals: POR, PWM, WDT
• Number Of I /o: 111
• Program Memory Size: 832KB (832K x 8)
• Program Memory Type: FLASH
• Ram Size: 68K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 24x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 105°C
• Package / Case: 144-LFQFP
• Processor Series: ST10F27x
• Core: ST10
• Data Bus Width: 16 bit
• Data Ram Size: 68 KB
• Interface Type: CAN, I2C
• Maximum Clock Frequency: 48 MHz
• Number Of Programmable I/os: 111
• Number Of Timers: 2
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 24 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: No

ST10F276E
Note:
23.7.3
Figure 46. A/D conversion characteristic
Digital
out
(HEX)
Offset error OFS
3FE
3FD
3FC
3FB
3FA
3FF
007
006
005
004
003
002
001
000
Nonlinearity error
Nonlinearity error is the deviation between actual and the best-fitting A/D conversion charac-
teristics (see
Bisector characteristic is obtained drawing a line from 1/2 LSB before the first step of the
real characteristic, and 1/2 LSB after the last step again of the real characteristic.
Total unadjusted error
The total unadjusted error (TUE) specifies the maximum deviation from the ideal character-
istic: The number provided in the datasheet represents the maximum error with respect to
the entire characteristic. It is a combination of the offset, gain and integral linearity errors.
The different errors may compensate each other depending on the relative sign of the offset
and gain errors. Refer to
1
–
–
2
Differential nonlinearity error is the actual step dimension versus the ideal one (1
LSB
Integral nonlinearity error is the distance between the center of the actual step and
the center of the bisector line, in the actual characteristics. Note that for integral
nonlinearity error, the effect of offset, gain and quantization errors is not included.
3
Figure
IDEAL
Ideal characteristic
4
1 LSB (ideal)
5
).
VAIN (LSBIDEAL)
[LSBIDEAL = VAREF / 1024]
46):
(7)
6
(4)
Figure
(3)
7
(2)
(5)
46, see TUE.
1018
(6)
1020
(1)
Offset error OFS
1022
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) Differential Nonlinearity Error (DNL)
(4) Integral Nonlinearity Error (INL)
(5) Center of a step of the actual transfer curve
(6) Quantization Error (1/2 LSB)
(7) Total Unadjusted Error (TUE)
1024
Bisector characteristic
Gain error GE
Electrical characteristics
187/231