PN2222ATF Fairchild Semiconductor, PN2222ATF Datasheet - Page 3
![TRANSISTOR GP NPN 40V TO-92](/photos/5/41/54198/to-92_pkg_sml.jpg)
PN2222ATF
Manufacturer Part Number
PN2222ATF
Description
TRANSISTOR GP NPN 40V TO-92
Manufacturer
Fairchild Semiconductor
Datasheet
1.PN2222ATFR.pdf
(5 pages)
Specifications of PN2222ATF
Transistor Type
NPN
Current - Collector (ic) (max)
1A
Voltage - Collector Emitter Breakdown (max)
40V
Vce Saturation (max) @ Ib, Ic
1V @ 50mA, 500mA
Dc Current Gain (hfe) (min) @ Ic, Vce
100 @ 150mA, 10V
Power - Max
625mW
Frequency - Transition
300MHz
Mounting Type
Through Hole
Package / Case
TO-92-3 (Standard Body), TO-226
Configuration
Single
Transistor Polarity
NPN
Mounting Style
Through Hole
Collector- Emitter Voltage Vceo Max
40 V
Emitter- Base Voltage Vebo
6 V
Continuous Collector Current
1 A
Maximum Dc Collector Current
1 A
Power Dissipation
625 mW
Maximum Operating Frequency
300 MHz
Maximum Operating Temperature
+ 150 C
Dc Collector/base Gain Hfe Min
100
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current - Collector Cutoff (max)
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
PN2222ATF
Manufacturer:
FSC
Quantity:
362 000
Part Number:
PN2222ATF
Manufacturer:
ON/安森美
Quantity:
20 000
Company:
Part Number:
PN2222ATFR
Manufacturer:
FSC
Quantity:
618 000
Part Number:
PN2222ATFR
Manufacturer:
ON/安森美
Quantity:
20 000
Lot
Q20070371AAPRCL
Q20070371ABPRCL
Q20070371BAPRCL
Test: (Temperature Humidity Biased Test)
Lot
Q20070371AATHBT
Q20070371ABTHBT
Q20070371BATHBT
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070371AATMCL1
Q20070371AATMCL1
Q20070371ABTMCL1
Q20070371ABTMCL1
Q20070371BATMCL1
Q20070371BATMCL1
Test: Ambient Storage for Whisker Growth (Storage Bake)
Lot
Q20070371AASBAKE
Q20070371ABSBAKE
Q20070371BASBAKE
Test: TMCL for Whisker Growth (Temperature Cycle)
Lot
Q20070371AATMCL4
Q20070371ABTMCL4
Q20070371BATMCL4
Test: Temp/Humidity Storage for Whisker Growth (Aging Bake)
Lot
Q20070371AAABAKE
Q20070371ABABAKE
Q20070371BAABAKE
Product Id Description :
Affected FSIDs :
2N3904BU
2N3904CTA
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSB564ACGBU
KSB564ACGBU
KSB564ACGBU
KSP44BU_NL
KSP44BU_NL
Device
KSB564ACGBU
KSB564ACGBU
KSP44BU_NL
2N3904BU_NL
2N3904NLBU
168-HOURS
0/77
0/77
0/129
2000-HOURS
0/3
0/3
0/3
500-CYCLES
0/3
0/3
0/3
2000-HOURS
0/3
0/3
0/3
200-CYCLES
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/129
3000-HOURS
0/3
0/3
0/3
1000-CYCLES
0/3
0/3
0/3
3000-HOURS
0/3
0/3
0/3
500-CYCLES
0/77
0/77
0/77
1000-HOURS
0/77
0/77
1/129
4000-HOURS
0/3
0/3
0/3
1500
0/3
0/3
0/3
4000-HOURS
0/3
0/3
0/3
2N3904CBU
2N3904TA
Failure Code
Failure Code
Bake Recoverable
(Moisture Induced
Leakage)
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 3