5962-9314402MUA QP SEMICONDUCTOR, 5962-9314402MUA Datasheet - Page 22

• Manufacturer Part Number: 5962-9314402MUA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9314402MUA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
subgroups 7 and 8 shall include verifying the functionality of the device.
9, 10, and 11. Either of two techniques is acceptable:
affect the performance of the device. For device class M, procedures and circuits shall be maintained under document revision
level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon request. For
device classes Q and V, the procedures and circuits shall be under the control of the device manufacturer's TRB in accordance
with MIL-PRF-38535 and shall be made available to the preparing activity or acquiring activity upon request. Testing shall be on
all pins, on five devices with zero failures. Latch-up test shall be considered destructive. Information contained in JEDEC
Standard EIA/JESD78 may be used for reference.
design changes which may affect input or output capacitance. Capacitance shall be measured between the designated terminal
and GND at a frequency equal or less than 1 MHz. Sample size is 15 devices with no failures, and all input and output terminals
tested.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
4.4.1 Group A inspection.
4.2.2 Additional criteria for device classes Q and V - Continued.
b.
c.
a.
b.
c.
d.
e.
f.
(1)
(2)
Interim and final electrical test parameters shall be as specified in table IIA herein.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
Tests shall be as specified in table IIA herein.
Subgroups 5 and 6 of table I of method 5005 of MIL-STD-883 shall be omitted.
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V,
Devices shall be tested for programmability and ac performance compliance to the requirements of Group A, subgroups
O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
Subgroup 4 (C IN and C OUT measurements) shall be measured only for initial qualification and after any process or
DEFENSE SUPPLY CENTER COLUMBUS
Testing the lot using additional built-in test circuitry which allows the manufacturer to verify programmability and ac
If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
performance without programming the user array. If this is done, the resulting test patterns shall be verified on all
devices during subgroups 9, 10, and 11, group A testing per the sampling plan specified in MIL-STD-883, method
5005.
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 3.2.3.1). If more than one device fails to program, the lot shall be rejected. At the manufacturers
option, the sample may be increased to 24 total devices with no more than two total device failures allowable. Ten
devices from the programmability sample shall be submitted to the requirements of group A, subgroup 9, 10, and
11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be
increased to 20 total devices with no more than four total device failures allowable. After completion of all testing,
the devices shall be erased and verified except devices submitted to groups C and D testing.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-93144
22