5962-9314402MUA QP SEMICONDUCTOR, 5962-9314402MUA Datasheet - Page 24

• Manufacturer Part Number: 5962-9314402MUA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9314402MUA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
1/
2/
3/
4/
5/
6/
7/
Line
no.
6a
10
1
2
3
4
5
6
7
8
9
Blank spaces indicate tests are not applicable.
Any or all subgroups may be combined when using high-speed testers.
Subgroups 7 and 8 functional tests shall verify the truth table.
* indicates PDA applies to subgroup 1 and 7.
** see 4.4.1f.
∆ indicates delta limit (see table IIB) shall be required where specified, and the delta values shall be
computed with reference to the previous interim electrical parameters (see line 1).
See 4.4.1e.
STANDARD
devices
Interim electrical
Static burn-in
Same as line 1
Dynamic burn-in
Same as line 1
Final electrical test
Final electrical test
Group A test
Group C end-point
Group D end-point
Group E end-point
parameters
(see 4.2)
(method 1015)
(method 1015)
parameters for
unprogrammed
parameters for
programmed devices
requirements
electrical
parameters
electrical
parameters
electrical]
parameters
Test requirements
TABLE IIA. Electrical test requirements. 1/ 2/ 3/ 4/ 5/ 6/ 7/
1*,2,3,7*,
8A,8B
1*,2,3,7*,
8A,8B,9
1,2,3,4**,
7,8A,8B,9,
10,11
Not
required
Required
2,3,7,
8A,8B
2,3,7,
8A,8B
1,7,9
(in accordance with
TM 5005, table I)
MIL-STD-883,
Subgroups
Device
class
M
SIZE
A
1*,2,3,7*,
8A,8B
1*,2,3,7*,
8A,8B,9
1,2,3,4**,
7,8A,8B,9,
10,11
Not
required
Required
1,2,3,7,
8A,8B
2,3,7,
8A,8B
1,7,9
MIL-PRF-38535, table III)
Device
class
REVISION LEVEL
Q
(in accordance with
Subgroups
B
1*,2,3,7*,
8A,8B
1*,2,3,7*,
8A,8B,9
1,2,3,4**,
7,8A,8B,9,
10,11
1,2,3,7,
8A,8B,9,
10,11 ∆
1,7,9
2,8A,10
Required
2,3,7,
8A,8B
Required
1,7,9
or
1* ∆
7* ∆
Device
class
V
SHEET
5962-93144
24