STM32F207VET6 STMicroelectronics, STM32F207VET6 Datasheet - Page 112

• Manufacturer Part Number: STM32F207VET6
• Description: MCU ARM 512KB FLASH 100LQFP
• Manufacturer: STMicroelectronics
• Series: STM32r

Specifications of STM32F207VET6

• Core Processor: ARM® Cortex-M3™
• Core Size: 32-Bit
• Speed: 120MHz
• Connectivity: CAN, Ethernet, I²C, IrDA, LIN, MMC, SPI, UART/USART, USB OTG
• Peripherals: Brown-out Detect/Reset, DMA, I²S, LCD, POR, PWM, WDT
• Number Of I /o: 82
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Eeprom Size: -
• Ram Size: 132K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 16x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LFQFP
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 497-11171

Electrical characteristics
Note:
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Table 62.
1. Better performance could be achieved in restricted V
2. Based on characterization, not tested in production.
3. If IRROFF is set to V
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative currents.
Any positive injection current within the limits specified for I
Section 5.3.16
Figure 49. ADC accuracy characteristics
1. Example of an actual transfer curve.
2. Ideal transfer curve.
3. End point correlation line.
4. E
Symbol
a
temperature range.
EO = Offset Error: deviation between the first actual transition and the first ideal one.
EG = Gain Error: deviation between the last ideal transition and the last actual one.
ED = Differential Linearity Error: maximum deviation between actual steps and the ideal one.
EL = Integral Linearity Error: maximum deviation between any actual transition and the end point
correlation line.
EO
EG
ED
ET
EL
T
= Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves.
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
ADC accuracy
does not affect the ADC accuracy.
Parameter
DD
, this value can be lowered to 1.65 V when the device operates in a reduced
(1)
Doc ID 15818 Rev 6
f
f
V
PCLK2
ADC
DDA
= 30 MHz, R
= 1.8
= 60 MHz,
Test conditions
DD
(3)
, frequency and temperature ranges.
to 3.6 V
AIN
< 10 kΩ,
INJ(PIN)
STM32F205xx, STM32F207xx
and ΣI
±1.5
±1.5
±1.5
Typ
±2
±1
INJ(PIN)
Max
±2.5
±3
±2
±5
±3
(2)
in
Unit
LSB