IDT82V3255TFG IDT, Integrated Device Technology Inc, IDT82V3255TFG Datasheet - Page 20

no-image

IDT82V3255TFG

Manufacturer Part Number
IDT82V3255TFG
Description
IC PLL WAN SMC STRATUM 3 64-TQFP
Manufacturer
IDT, Integrated Device Technology Inc
Type
PLL Clock Generatorr
Datasheet

Specifications of IDT82V3255TFG

Input
CMOS, LVDS, PECL
Output
CMOS, LVDS, PECL
Frequency - Max
622.08MHz
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
64-TQFP, 64-VQFP
Frequency-max
622.08MHz
Function
Wan PLL
Operating Temperature (max)
85C
Operating Temperature (min)
-40C
Package Type
TQFP
Pin Count
64
Mounting
Surface Mount
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
82V3255TFG

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IDT82V3255TFG
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
Part Number:
IDT82V3255TFG
Manufacturer:
IDT
Quantity:
20 000
Part Number:
IDT82V3255TFG8
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
Company:
Part Number:
IDT82V3255TFG8
Quantity:
920
Company:
Part Number:
IDT82V3255TFG8
Quantity:
491
3.5
lowing aspects:
and T4 selected input clocks have to be monitored further. Refer to
Chapter 3.7 Selected Input Clock Monitoring
3.5.1
as shown in
The input clock is monitored for each period of 128 ms and the internal
leaky bucket accumulator increases by 1 when an event is detected; it
decreases by 1 if no event is detected within the period set by the decay
rate. The event is that an input clock drifts outside (>) ±500 ppm with
respect to the master clock within a 128 ms period.
The leaky bucket configuration for an input clock is selected by the cor-
Functional Description
IDT82V3255
Leaky Bucket Accumulator
The qualities of all the input clocks are always monitored in the fol-
The qualified clocks are available for T0/T4 DPLL selection. The T0
Activity is monitored by using an internal leaky bucket accumulator,
Each input clock is assigned an internal leaky bucket accumulator.
There are four configurations (0 - 3) for a leaky bucket accumulator.
No-activity Alarm Indication
• Activity
• Frequency
Input Clock
INPUT CLOCK QUALITY MONITORING
ACTIVITY MONITORING
Figure
4.
clock signal with no event
for details.
Figure 4. Input Clock Activity Monitoring
Decay
Rate
20
responding BUCKET_SEL[1:0] bits. Each leaky bucket configuration
consists of four elements: upper threshold, lower threshold, bucket size
and decay rate.
the accumulated events reach the bucket size, the accumulator will stop
increasing even if further events are detected. The upper threshold is a
point above which a no-activity alarm is raised. The lower threshold is a
point below which the no-activity alarm is cleared. The decay rate is a
certain period during which the accumulator decreases by 1 if no event
is detected.
of register bits: the BUCKET_SIZE_n_DATA[7:0] bits, the UPPER_
THRESHOLD_n_DATA[7:0]
DATA[7:0] bits and the DECAY_RATE_n_DATA[1:0] bits respectively; ‘n’
is 0 ~ 3.
INn_CMOS_NO_ACTIVITY_ALARM bit (n = 1, 2, or 3) /
INn_DIFF_NO_ACTIVITY_ALARM bit (n = 1 or 2).
tion for T0/T4 DPLL.
clock signal with events
The bucket size is the capability of the accumulator. If the number of
The leaky bucket configuration is programmed by one of four groups
The no-activity alarm status of the input clock is indicated by the
The input clock with a no-activity alarm is disqualified for clock selec-
bits,
the
LOWER_THRESHOLD_n_
December 3, 2008
Bucket Size
Upper Threshold
Lower Threshold
0
WAN PLL

Related parts for IDT82V3255TFG