GS8662Q18GE-250 GSI TECHNOLOGY, GS8662Q18GE-250 Datasheet - Page 19

• Manufacturer Part Number: GS8662Q18GE-250
• Manufacturer: GSI TECHNOLOGY

Capacitance
(T
AC Test Conditions
Input and Output Leakage Characteristics
Rev: 1.08 12/2007
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Note:
This parameter is sample tested.
Note:
Test conditions as specified with output loading as shown unless otherwise noted.
A
= 25
Output Leakage Current
o
Input Leakage Current
C, f = 1 MH
(except mode pins)
Output Capacitance
Clock Capacitance
Input Capacitance
Parameter
Parameter
Doff
DQ
Z
, V
Output reference level
DD
Input reference level
Max. input slew rate
Input high level
Input low level
= 1.8 V)
Parameter
Symbol
I
INDOFF
I
I
OL
IL
Symbol
VT = V
C
C
C
OUT
CLK
IN
AC Test Load Diagram
DDQ
19/35
/2
50Ω
Test Conditions
V
0 V ≤ V
V
Output Disable,
OUT
V
DD
IN
≥ V
= 0 to V
= 0 to V
Test conditions
IN
IN
≥ V
≤ V
V
V
V
DD
OUT
DDQ
IN
IN
IL
IL
= 0 V
= 0 V
RQ = 250 Ω (HSTL I/O)
V
= 0 V
GS8662Q08/09/18/36E-278/250/200/167
REF
= 0.75 V
–2 uA
–2 uA
–2 uA
–2 uA
Min.
Conditions
Typ.
V
1.25 V
0.25 V
0.75 V
2 V/ns
4
6
5
DDQ
/2
© 2005, GSI Technology
Max.
Max
2 uA
2 uA
2 uA
2 uA
5
7
6
Notes
Unit
pF
pF
pF