AT32UC3C164C Atmel Corporation, AT32UC3C164C Datasheet - Page 1204

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AT32UC3C164C

Manufacturer Part Number
AT32UC3C164C
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of AT32UC3C164C

Flash (kbytes)
64 Kbytes
Pin Count
100
Max. Operating Frequency
66 MHz
Cpu
32-bit AVR
Hardware Qtouch Acquisition
No
Max I/o Pins
81
Ext Interrupts
100
Usb Transceiver
1
Quadrature Decoder Channels
2
Usb Speed
Full Speed
Usb Interface
Device + OTG
Spi
7
Twi (i2c)
3
Uart
5
Can
2
Lin
5
Ssc
1
Ethernet
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
4
Resistive Touch Screen
No
Dac Channels
4
Dac Resolution (bits)
12
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
20
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
3.0 to 3.6 or 4.5 to 5.5
Operating Voltage (vcc)
3.0 to 3.6 or 4.5 to 5.5
Fpu
Yes
Mpu / Mmu
Yes / No
Timers
6
Output Compare Channels
22
Input Capture Channels
12
Pwm Channels
19
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

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39.4
39.4.1
39.4.2
32117C–AVR-08/11
JTAG and Boundary-scan (JTAG)
Features
Overview
Rev: 2.3.0.4
The JTAG Interface offers a four pin programming and debug solution, including boundary-scan
support for board-level testing.
Figure 39-5 on page 1205
Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(shift register) between the TDI-input and TDO-output.
The Instruction Register holds JTAG instructions controlling the behavior of a Data Register. The
Device Identification Register, Bypass Register, and the boundary-scan chain are the Data Reg-
isters used for board-level testing. The Reset Register can be used to keep the device reset
during test or programming.
The Service Access Bus (SAB) interface contains address and data registers for the Service
Access Bus, which gives access to On-Chip Debug, programming, and other functions in the
device. The SAB offers several modes of access to the address and data registers, as described
in
Section 39.5
document.
IEEE1149.1 compliant JTAG Interface
Boundary-scan Chain for board-level testing
Direct memory access and programming capabilities through JTAG Interface
Section
39.4.11.
lists the supported JTAG instructions, with references to the description in this
shows how the JTAG is connected in an 32-bit AVR device. The TAP
AT32UC3C
1204

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