st62t25cn6 STMicroelectronics, st62t25cn6 Datasheet - Page 78

• Manufacturer Part Number: st62t25cn6
• Description: 8-bit Mcus With A/d Converter, Two Timers, Oscillator Safeguard & Safe Reset
• Manufacturer: STMicroelectronics

ST6215C/ST6225C
11.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
11.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 µF and 0.1 µF decoupling capacitors on the power supply lines are proposed as a good price vs.
Figure 56. EMC Recommended Star Network Power Supply Connection
78/105
1
Symbol
EMC performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC rec-
ommendations are given in other sections (I/Os, RESET, OSCx pin characteristics).
V
V
FESD
FFTB
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
POWER
SUPPLY
SOURCE
Parameter
V
DD
DD
and V
ST6
DIGITAL NOISE
FILTERING
(close to the MCU)
DD
pins
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
DD
DD
10 µF
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
0.1 µF
A
A
Conditions
+25°C, f
+25°C, f
V
V
DD
SS
OSC
OSC
8MHz
8MHz
ST62XX
2)
Neg
-2.5
-2
DD
1)
and V
Pos
2
3
SS
1)
through
Unit
kV