at85c51snd3b ATMEL Corporation, at85c51snd3b Datasheet - Page 242
at85c51snd3b
Manufacturer Part Number
at85c51snd3b
Description
Single-chip Digital Audio Decoder - Encoder With Usb 2.0 Interface
Manufacturer
ATMEL Corporation
Datasheet
1.AT85C51SND3B.pdf
(270 pages)
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Electrical Characteristics
Absolute Maximum Rating
DC Characteristics
Digital Logic
242
Storage Temperature ......................................... -65 to +150°C
Voltage on any other Pin to V
I
Power Dissipation ............................................................. 1 W
Operating Conditions
Ambient Temperature Under Bias........................ -40 to +85°C
V
OL
DD ...................................................................................................................
per I/O Pin ................................................................. 5 mA
AT85C51SND3B
SS ....................................
Table 263. Digital DC Characteristics
IOV
Notes:
Symbol Parameter
V
V
R
V
V
V
C
V
I
OH1
OH2
I
I
RST
TL
IH1
IH2
IL
LI
OL
DD
IO
IL
= 1.65 to 3.6 V; T
1. Typical values are obtained at T
Input Low Voltage
Input High Voltage (except X1)
Input High Voltage ( X1)
Output Low Voltage
Output High Voltage
(P0, P1, P2, P3, P4, P5)
Output High Voltage
(NFD7:0,
NFRE, NFWE, NFCE3:0, LD7:0,
SDCMD, SDLCK, SDDAT3:0,
RXD, TXD, MISO, MOSI, RTS,
LCS,
LWR/LRW, SCS, SRD, SWR,
SA0,
DSEL)
Logical 0 Input Current
(P0, P1, P2, P3, P4, P5)
Input Leakage Current
(NFD7:0,
NFRE, NFWE, NFCE0)
Logical 1 to 0 Transition Current
(P0, P1, P2, P3, P4 and P5)
RST Pull-Up Resistor
Pin Capacitance
-0.3 to +4.0 V
tee on these values.
OCLK,
LA0/LRS,
TBD V
NFALE,
NFALE,
DCLK,
A
= -40 to +85° C
LRD/LDE,
NFCLE,
NFCLE,
*NOTICE:
DDAT,
0.65·IOV
0.7·IOV
IOV
IOV
-0.5
Min
DD
DD
10
A
= 25°C. They are not tested and there is no guaran-
-0.7
-0.7
Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
DD
DD
Typ
16
10
(1)
0.25·IOV
IOV
IOV
-650
Max
-50
0.4
DD
DD
10
21
+0.5
+0.5
DD
Units
µ A
µ A
µ A
k Ω
pF
V
V
V
V
V
V
I
I
I
V
0 < V
V
V
T
OL
OH
OH
A
IN
IN
IN
= 25 ° C
= 3 mA
= -30 A
= -3 mA
Test Conditions
= 0.4 V
= 1.0 V
= 2.0 V
IN
7632C–MP3–11/06
< V
DD
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