pxf4336 Infineon Technologies Corporation, pxf4336 Datasheet - Page 420

• Manufacturer Part Number: pxf4336
• Description: Abm Premium Atm Buf Fer Manager
• Manufacturer: Infineon Technologies Corporation

9
A Test Access Port (TAP) is implemented in the ABM-P. The essential part of the TAP
is a finite state machine (16 states) controlling the different operational modes of the
boundary scan. Both the TAP controller and boundary scan meet the requirements given
by the JTAG standard: IEEE 1149.1.
controller.
•
Figure 9-1
If no boundary scan operation is planned, TRST must be connected with V
TDI do not need to be connected since pull-up transistors ensure high input levels in this
case. Nevertheless, it is good practice to set the unused inputs to defined levels.
In this case, if the JTAG is not used:
TMS = TCK = ‘1’ is recommended.
Test handling (boundary scan operation) is performed via the pins TCK (Test Clock),
TMS (Test Mode Select), TDI (Test Data Input), and TDO (Test Data Output) when the
TAP controller is not in its reset state; i.e., TRST is connected to V
unconnected due to its internal pull up. Test data at TDI are loaded with a clock signal
connected to TCK. ‘1’ or ‘0’ on TMS causes a transition from one controller state to
another; constant ‘1’ on TMS leads to normal operation of the chip.
An Input pin (I) uses one boundary scan cell (data in); an Output pin (O) uses two cells
(data out, enable); and an I/O-pin (I/O) uses three cells (data in, data out, enable). Note
that most functional output and input pins of the ABM-P are tested as I/O pins in
boundary scan, thus using three cells. The boundary scan unit of the ABM-P contains a
Data Sheet
Test Mode
Block Diagram of Test Access Port and Boundary Scan Unit
TCK
TRST
TMS
TDI
TDO
CLOCK
Reset
Test
Control
Data in
Enable
Data out
Test Access Port (TAP)
- Finite State Machine
- Instruction Register (4 bit)
- Test Signal Generator
Clock Generation
TAP Controller
CLOCK
Figure 9-1
420
gives an overview about the TAP
ID Data out
Control
Bus
SS Data
out
PXF 4336 V1.1
DD3
2
1
n
Pins
or it remains
.
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.
.
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SS
Test Mode
. TMS and
2001-12-17
ABM-P