saa4955tj NXP Semiconductors, saa4955tj Datasheet - Page 9

• Manufacturer Part Number: saa4955tj
• Description: 2.9-mbit Field Memory
• Manufacturer: NXP Semiconductors

Philips Semiconductors
Cascade operation
If a longer delay is needed, the total storage depth can be
increased beyond 2949264 bits by cascading several
SAA4955TJs. For details see the interconnection and
timing diagrams (Figs 17 and 18).
Test mode operation
The SAA4955TJ incorporates a test mode not intended for
customer use. If WE and RSTW are held HIGH
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
Notes
1. Machine model: equivalent to discharging a 200 pF capacitor through a 0
2. Human body model: equivalent to discharging a 100 pF capacitor through a 1500
THERMAL CHARACTERISTICS
1999 Apr 29
V
V
V
V
I
I
P
T
T
T
V
R
DD(tot)
O
SYMBOL
SYMBOL
V
stg
j
amb
DD
DD(P)
I
O
tot
es
th(j-a)
2.9-Mbit field memory
0.75 H + 10 ).
, V
DD(O)
supply voltages
supply voltage for protection circuits
input voltage
output voltage
total supply current
voltage difference between GND,
GND
short circuit output current
total power dissipation
storage temperature
junction temperature
ambient temperature
electrostatic handling
thermal resistance from junction to ambient
O
and GND
PARAMETER
P
PARAMETER
V
V
V
V
note 1
note 2
DD(P)
DD
DD(P)
DD
9
= V
= V
continuously for 1024 SWCK clock cycles, the
SAA4955TJ will enter test mode. It will exit test mode if WE
is LOW for a single SWCK cycle or if RSTW is LOW for
2 SWCK clock cycles.
= 5 V
= 5 V
CONDITIONS
DD(O)
DD(O)
= V
= V
in free air
DD(P)
DD(P)
CONDITIONS
= 3.3 V
= 3.3 V
series resistor (‘0 ’ is actually
0
0
0.5
0.5
0.5
0.5
0.5
0.5
0.5
20
150
2000
series resistor.
MIN.
+5
+5.5
+5.5
+3.8
+5
+3.8
200
+0.5
50
750
+150
125
70
+200
+2000
Product specification
SAA4955TJ
VALUE
MAX.
60
V
V
V
V
V
V
mA
V
mA
mW
V
V
C
C
C
UNIT
UNIT
K/W