mt18vddt12872ag-335 Micron Semiconductor Products, mt18vddt12872ag-335 Datasheet - Page 19

• Manufacturer Part Number: mt18vddt12872ag-335
• Description: 256mb, 512mb, 1gb, 2gb X72, Ecc, Dr 184-pin Ddr Sdram Udimm
• Manufacturer: Micron Semiconductor Products

Notes
pdf: 09005aef80814e61, source: 09005aef807f8acb
DD18C32_64_128_256x72AG.fm - Rev. B 9/04 EN
10. I
11. This parameter is sampled. V
1. All voltages referenced to V
2. Tests for AC timing, I
3. Outputs measured with equivalent load:
4. AC timing and I
5. The AC and DC input level specifications are as
6. V
7. V
8. I
9. Enables on-chip refresh and address counters.
characteristics may be conducted at nominal ref-
erence/supply voltage levels, but the related spec-
ifications and device operation are guaranteed for
the full voltage range specified.
swing of up to 1.5V in the test environment, but
input timing is still referenced to V
crossing point for CK/CK#), and parameter speci-
fications are guaranteed for the specified AC input
levels under normal use conditions. The mini-
mum slew rate for the input signals used to test
the device is 1V/ns in the range between V
and V
defined in the SSTL_2 Standard (i.e., the receiver
will effectively switch as a result of the signal
crossing the AC input level, and will remain in that
state as long as the signal does not ring back
above [below] the DC input LOW [HIGH] level).
ting device and to track variations in the DC level
of the same. Peak-to-peak noise (non-common
mode) on V
DC value. Thus, from V
±25mV for DC error and an additional ±25mV for
AC noise. This measurement is to be taken at the
nearest V
system supply for signal termination resistors, is
expected to be set equal to V
variations in the DC level of V
rates. Specified values are obtained with mini-
mum cycle time at CL = 2 for -262, and -26A, CL =
2.5 for -265 and -335 with the outputs open.
properly initialized, and is averaged at the defined
cycle rate.
V
T
DD
DD
REF
A
TT
DD
= 25°C, V
is dependent upon output loading and cycle
Q = +2.5V ±0.2V, V
is not applied directly to the device. V
specifications are tested after the device is
is expected to equal V
IH
(AC).
REF
REF
OUT
Output
(V
by-pass capacitor.
OUT
may not exceed ±2 percent of the
)
(DC) = V
DD
V
DD
tests may use a V
TT
50
30pF
, and electrical AC and DC
Reference
Point
REF
DD
DD
SS
DD
Q/2, V
= V
.
REF
Q/2, V
Q/2 of the transmit-
REF
DD
SS
.
, f = 100 MHz,
and must track
= +2.5V ±0.2V,
REF
REF
OUT
is allowed
(or to the
IL
(peak to
-to-V
TT
256MB, 512MB, 1GB, 2GB (x72, ECC, DR)
IL
(AC)
is a
IH
19
12. For slew rates < 1V/ns and
13. The CK/CK# input reference level (for timing ref-
14. Inputs are not recognized as valid until V
15. The output timing reference level, as measured at
16.
17. The intent of the Don’t Care state after completion
18. This is not a device limit. The device will operate
19. It is recommended that DQS be valid (HIGH or
20. MIN (
21. The refresh period 64ms. This equates to an aver-
peak) = 0.2V. DM input is grouped with I/O pins,
reflecting the fact that they are matched in load-
ing.
0.5V/ns, timing must be derated:
tional 50ps per each 100 mV/ns reduction in slew
rate from 500 mV/ns, while
rate exceeds 4.5 V/ns, functionality is uncertain.
erenced to CK/CK#) is the point at which CK and
CK# cross; the input reference level for signals
other than CK/CK# is V
lizes. Exception: during the period before V
stabilizes, CKE 0.3 x V
the timing reference point indicated in Note 3, is
V
t
time windows as data valid transitions. These
parameters are not referenced to a specific voltage
level, but specify when the device output is no
longer driving (HZ) or begins driving (LZ).
of the postamble is that the DQS-driven signal
should either be high, low, or high-Z and that any
signal transition within the input switching region
must follow valid input requirements. That is, if
DQS transitions high [above V
must not transition low (below V
t
with a negative value, but system performance
could be degraded due to bus turnaround.
LOW) on or before the WRITE command. The
case shown (DQS going from High-Z to logic
LOW) applies when no WRITEs were previously in
progress on the bus. If a previous WRITE was in
progress, DQS could be HIGH during this time,
depending on
smallest multiple of
absolute value for the respective parameter.
(MAX) for I
ple of
value for
age refresh rate of 15.625µs (256MB) or 7.8125µs
(512MB, 1GB, 2GB). However, an AUTO REFRESH
HZ and
DQSH (MIN).
Micron Technology, Inc., reserves the right to change products or specifications without notice.
TT
184-PIN DDR SDRAM UDIMM
.
t
RC or
t
CK that meets the maximum absolute
t
t
LZ transitions occur in the same access
RAS.
DD
t
RFC) for I
t
measurements is the largest multi-
DQSS.
t
CK that meets the minimum
REF
DD
©2004 Micron Technology, Inc. All rights reserved.
DD
Q is recognized as LOW.
.
t
IH is unaffected. If slew
0.5Vns. If slew rate is <
measurements is the
IHDC
t
IS has an addi-
IHDC
(MIN)] then it
) prior to
REF
stabi-
t
RAS
REF