N04L163WC1AB NANOAMP [NanoAmp Solutions, Inc.], N04L163WC1AB Datasheet - Page 4

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N04L163WC1AB

Manufacturer Part Number
N04L163WC1AB
Description
4Mb Ultra-Low Power Asynchronous CMOS SRAM
Manufacturer
NANOAMP [NanoAmp Solutions, Inc.]
Datasheet
NanoAmp Solutions, Inc.
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
Absolute Maximum Ratings
1. Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional
Operating Characteristics (Over Specified Temperature Range)
1. Typical values are measured at Vcc=Vcc Typ., T
2. This parameter is specified with the outputs disabled to avoid external loading effects. The user must add current required to drive
3. This device assumes a standby mode if the chip is disabled (CE high or UB and LB high). In order to achieve low standby current
Page Mode Operating Supply Current
Read/Write Quiescent Operating Sup-
Read/Write Operating Supply Current
Read/Write Operating Supply Current
@ 70ns Cycle Time
Savings with Page Mode Operation
Maximum Data Retention Current
operation of the device at these or any other conditions above those indicated in the operating section of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
output capacitance expected in the actual system.
all inputs must be within 0.2 volts of either VCC or VSS
Maximum Standby Current
Voltage on V
Output Leakage Current
Data Retention Voltage
Input Leakage Current
Voltage on any pin relative to V
Soldering Temperature and Time
@ 70ns Cycle Time
Output High Voltage
@ 1 µs Cycle Time
Output Low Voltage
Input High Voltage
Input Low Voltage
Supply Voltage
ply Current
Operating Temperature
Storage Temperature
diagram)
Power Dissipation
Item
CC
2
Supply Relative to V
(Refer to Power
Item
3
2
2
3
3
1
SS
Symbol
(DOC# 14-02-018 REV I ECN# 01-1001)
V
V
V
I
I
I
I
I
V
SS
V
I
V
I
CC1
CC2
CC3
CC4
SB1
I
DR
LO
CC
DR
OH
OL
LI
IH
IL
A
=25°C and are not 100% tested.
V
OE = V
V
V
V
V
Chip Disabled, t
CC
Chip Enabled, I
CC
Chip Enabled, I
CC
Chip Enabled, I
CC
Chip Enabled, I
CC
t
A
= 85
=3.6 V, V
=3.6 V, V
=3.6 V, V
=3.6 V, V
= 1.8V, V
Test Conditions
T
V
Symbol
V
Chip Disabled
V
Chip Disabled
SOLDER
I
IN
T
IN,OUT
I
V
OL
IH
IN
OH
P
STG
T
o
CC
= V
A
C, VCC = 3.6 V
D
or Chip Disabled
= 0 to V
= -0.2mA
= 0.2mA
f = 0
CC
IN
IN
IN
IN
IN
=V
=V
=V
=V
or 0V
= V
OUT
A
OUT
OUT
OUT
CC
IH
IH
IH
IH
= 85
CC
2
or V
or V
or V
or V
= 0,
= 0
= 0
= 0
o
or 0
C
IL
IL
IL
IL
–0.3 to V
N04L163WC1A
260
–0.3 to 4.5
–40 to 125
-40 to +85
V
Rating
CC
o
Min.
–0.3
C, 10sec
2.3
1.8
1.8
500
–0.2
CC
+0.3
Typ
3.0
2.0
4.0
10
4
1
V
CC
Max
16.0
3.6
0.6
0.2
0.5
0.5
3.0
3.0
20
10
+0.3
Unit
mW
o
o
o
V
V
C
C
C
Unit
mA
mA
mA
mA
µA
µA
µA
µA
V
V
V
V
V
V
4

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