LPC2917/01 NXP [NXP Semiconductors], LPC2917/01 Datasheet - Page 70
LPC2917/01
Manufacturer Part Number
LPC2917/01
Description
ARM9 microcontroller with CAN and LIN
Manufacturer
NXP [NXP Semiconductors]
Datasheet
1.LPC291701.pdf
(86 pages)
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NXP Semiconductors
Table 36.
V
ground; positive currents flow into the IC; unless otherwise specified
[1]
[2]
[3]
Table 37.
V
T
specified.
[1]
LPC2917_19_01_2
Preliminary data sheet
Symbol
t
Symbol
f
t
f(o)
SPI
su(SPI_MISO)
vj
DD(CORE)
DD(CORE)
= -40 C to +85 C; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
temperature on wafer level. Cased products are tested at T
test conditions to cover the specified temperature and power supply voltage range.
Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages.
Bus capacitance C
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
temperature on wafer level. Cased products are tested at T
test conditions to cover the specified temperature and power supply voltage range.
[1]
= V
= V
Dynamic characteristic: I
Dynamic characteristics of SPI pins
DD(OSC_PLL)
DD(OSC_PLL)
Parameter
SPI operating frequency
SPI_MISO set-up time
9.2 Dynamic characteristics: I
9.3 Dynamic characteristics: SPI
Parameter
output fall time
b
in pF, from 10 pF to 400 pF.
; V
; V
Fig 26. SPI data input set-up time in SSP Master mode
DD(IO)
DD(IO)
SDOn
SCKn
shifting edges
SDIn
= 2.7 V to 3.6 V; V
= 2.7 V to 3.6 V; V
2
C-bus pins
Rev. 02 — 17 June 2009
Conditions
master operation
slave operation
T
measured in SPI
Master mode;
see
DDA(ADC3V3)
amb
DDA(ADC3V3)
Figure 26
Conditions
V
amb
= 25 C;
amb
IH
to V
= 25 C (final testing). Both pre-testing and final testing use correlated
= 25 C (final testing). Both pre-testing and final testing use correlated
2
C-bus interface
= 3.0 V to 3.6 V; all voltages are measured with respect to
IL
LPC2917/01; LPC2919/01
= 3.0 V to 3.6 V; V
t
su(SPI_MISO)
[1]
ARM9 microcontroller with CAN and LIN
Min
20 + 0.1
Min
1
1
-
65024
65024
DDA(ADC5V0)
f
f
clk(SPI)
clk(SPI)
C
b
[3]
= 3.0 V to 5.5 V;
Typ
-
Typ
-
-
11
[2]
sampling edges
© NXP B.V. 2009. All rights reserved.
Max
1
1
-
2
4
amb
amb
Max
-
f
f
clk(SPI)
clk(SPI)
= 85 C ambient
= 85 C ambient
002aae695
Unit
MHz
MHz
ns
70 of 86
Unit
ns
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