LPC2917/01 NXP [NXP Semiconductors], LPC2917/01 Datasheet - Page 74
LPC2917/01
Manufacturer Part Number
LPC2917/01
Description
ARM9 microcontroller with CAN and LIN
Manufacturer
NXP [NXP Semiconductors]
Datasheet
1.LPC291701.pdf
(86 pages)
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NXP Semiconductors
Table 41.
V
ground.
[1]
[2]
10. Application information
LPC2917_19_01_2
Preliminary data sheet
Symbol
f
f
t
i(ADC)
s(max)
conv
DD(CORE)
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
temperature on wafer level. Cased products are tested at T
test conditions to cover the specified temperature and power supply voltage range.
Duty cycle clock should be as close as possible to 50 %.
[1]
= V
ADC dynamic characteristics
DD(OSC_PLL)
Parameter
ADC input frequency
maximum sampling rate
conversion time
10.1 Operating frequency selection
9.6 Dynamic characteristics: ADC
The LPC2917/2919/01 is specified to operate at a maximum frequency of 125 MHz,
maximum temperature of 85 C, and maximum core voltage of 1.89 V.
Figure 30
LPC2917/2919/01 by controlling the temperature and the core voltage accordingly.
; V
Fig 29. Core operating frequency versus temperature for different core voltages
DD(IO)
frequency
(MHz)
core
= 2.7 V to 3.6 V; V
145
135
125
115
105
show that the user can achieve higher operating frequencies for the
25
Conditions
f
f
n = resolution
In number of ADC
clock cycles
In number of bits
i(ADC)
s
V
= f
resolution 2 bit
resolution 10 bit
DD(CORE)
V
V
DD(CORE)
DD(CORE)
i(ADC)
= 4.5 MHz;
Rev. 02 — 17 June 2009
DDA(ADC3V3)
/(n + 1) with
= 1.65 V
= 1.95 V
= 1.8 V
amb
= 25 C (final testing). Both pre-testing and final testing use correlated
45
= 3.0 V to 3.6 V; all voltages are measured with respect to
LPC2917/01; LPC2919/01
[2]
ARM9 microcontroller with CAN and LIN
Min
4
-
3
2
-
65
Typ
-
-
-
-
-
temperature ( C)
Max
4.5
1500
400
11
10
Figure 29
002aae194
© NXP B.V. 2009. All rights reserved.
amb
= 85 C ambient
85
Unit
MHz
ksample/s
ksample/s
cycles
bits
and
74 of 86
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