STR910FAZ32H6T STMICROELECTRONICS [STMicroelectronics], STR910FAZ32H6T Datasheet - Page 70

• Manufacturer Part Number: STR910FAZ32H6T
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

Electrical characteristics
7.9.3
7.9.4
Table 28.
1. Data based on characterization results, not tested in production.
7.9.5
7.9.6
70/99
V
V
ESD(HBM)
ESD(CDM)
Symbol
ESD data
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
Electro-static discharge (ESD)
Electro-Static Discharges (3 positive then 3 negative pulses separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the JESD22-A114A/A115A standard. For more details, refer to the application
note AN1181.
Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up
performance.
●
●
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations:
The software flowchart must include the management of runaway conditions such as:
●
●
●
Prequalification trials:
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Charged Device Model)
A supply overvoltage (applied to each power supply pin) and
A current injection (applied to each input, output and configurable I/O pin) are
performed on each sample.
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Ratings
T
conforming to
JESD22-A114
T
conforming to
JESD22-C101
A
A
=+25°C
=+25°C
Conditions
STR91xFAx32 STR91xFAx42 STR91xFAx44
Class
2
II
Maximum
value
+/-2000
1000
(1)
Unit
V