TS83C51RD2 ATMEL [ATMEL Corporation], TS83C51RD2 Datasheet - Page 14
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TS83C51RD2
Manufacturer Part Number
TS83C51RD2
Description
Qualification Package TS87C51RD2 / TS83C51RD2 CMOS 0.5Um
Manufacturer
ATMEL [ATMEL Corporation]
Datasheet
1.TS83C51RD2.pdf
(17 pages)
Qualpack TS87C51RD2/TS83C51RD2
4.3
This section summarizes the cumulated package level qualification data of the TS87C51RD2.
4.3.1 Design tests
4.3.2 Package tests
4.3.3 Qualification status
The TS87C51RD2 and TS83C51RD2 have been qualified in July 1999.
June 2001
Lots
Z28303C
Z34922E
Z33543
Z28882
Lots
Z28303C
Z34922E
Z33543
Z25873C
T87C51RD2 Qualification Tests
Device Type Test Description
TS87C51RD2
PLCC44
TS83C51RD2
DIL 40.6
Device Type
TS87C51RD2
PLCC44
PLCC44
EFR Dynamic Life Test
LFR Dynamic Life Test
Data Retention 165°c
ESD
Latch-up
Test Description
85/85 Humidity
Thermal Cycles
Moisture preconditioning
Level 1
Thermal Sh. -65°c/150°c
HAST 130°c/85%rh
Marking permanency
(resistance to solvents)
Solderability
Step
CSAM
1000h
1000c
500h
144h
500c
Test
15ts
72h
-
-
Result Comment
Step
0/150
0/150
0/150
0/150
0/180
0/150
0/150
0/150
0/30
50mW
1000h
1000h
3000v
4000v
0/3
0/3
500h
500h
7.5v
12h
Pass level 1 of JEDEC 20
Atmel Wireless & Microcontrollers
Result
0/900
0/300
0/300
0/150
0/150
0/3
0/3
0/5
0/5
EFR: 0 ppm
LFR: 19 fit
Class 3
Latch-up free
Comment