GS8160F36BT-5.5V GSI [GSI Technology], GS8160F36BT-5.5V Datasheet

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GS8160F36BT-5.5V

Manufacturer Part Number
GS8160F36BT-5.5V
Description
1M x 18, 512K x 32, 512K x 36 18Mb Sync Burst SRAMs
Manufacturer
GSI [GSI Technology]
Datasheet
100-Pin TQFP
Commercial Temp
Industrial Temp
Features
• Flow Through mode operation; Pin 14 = No Connect
• 1.8 V or 2.5 V core power supply
• 1.8 V or 2.5 V I/O supply
• LBO pin for Linear or Interleaved Burst mode
• Internal input resistors on mode pins allow floating mode pins
• Byte Write (BW) and/or Global Write (GW) operation
• Internal self-timed write cycle
• Automatic power-down for portable applications
• JEDEC-standard 100-lead TQFP package
• RoHS-compliant 100-lead TQFP package available
Functional Description
Applications
The GS8160FxxBT-xxxV is an 18,874,368-bit (16,777,216-bit
for x32 version) high performance synchronous SRAM with a
2-bit burst address counter. Although of a type originally
developed for Level 2 Cache applications supporting high
performance CPUs, the device now finds application in
synchronous SRAM applications, ranging from DSP main
store to networking chip set support.
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst
control inputs (ADSP, ADSC, ADV), and write control inputs
(Bx, BW, GW) are synchronous and are controlled by a
positive-edge-triggered clock input (CK). Output enable (G)
and power down control (ZZ) are asynchronous inputs. Burst
cycles can be initiated with either ADSP or ADSC inputs. In
Burst mode, subsequent burst addresses are generated
internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or
Rev: 1.01 5/2006
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Flow Through
2-1-1-1
1M x 18, 512K x 32, 512K x 36
18Mb Sync Burst SRAMs
Curr
Curr
tCycle
Parameter Synopsis
t
(x32/x36)
KQ
(x18)
1/21
interleave order with the Linear Burst Order (LBO) input. The
Burst function need not be used. New addresses can be loaded
on every cycle with no degradation of chip performance.
Designing For Compatibility
The JEDEC standard for Burst RAMS calls for a FT mode pin
option on Pin 14. Board sites for flow through Burst RAMS
should be designed with V
to ensure the broadest access to multiple vendor sources.
Boards designed with FT pin pads tied low may be stuffed with
GSI’s pipeline/flow through-configurable Burst RAMs or any
vendor’s flow through or configurable Burst SRAM. Boards
designed with the FT pin location tied high or floating must
employ a non-configurable flow through Burst RAM, like this
RAM, to achieve flow through functionality.
Byte Write and Global Write
Byte write operation is performed by using Byte Write enable
(BW) input combined with one or more individual byte write
signals (Bx). In addition, Global Write (GW) is available for
writing all bytes at one time, regardless of the Byte Write
control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion
(High) of the ZZ signal, or by stopping the clock (CK).
Memory data is retained during Sleep mode.
Core and Interface Voltages
The GS8160FxxBT-xxxV operates on a 1.8 V or 2.5 V power
supply. All input are 1.8 V or 2.5 V compatible. Separate
output power (V
from the internal circuits and are 1.8 V or 2.5 V compatible.
-5.5
210
240
5.5
5.5
-6.5
185
205
6.5
6.5
DDQ
-7.5
170
190
7.5
7.5
) pins are used to decouple output noise
SS
Unit
mA
mA
ns
ns
connected to the FT pin location
GS8160FxxBT-xxxV
© 2004, GSI Technology
1.8 V or 2.5 V V
1.8 V or 2.5 V I/O
Preliminary
5.5 ns–8.5 ns
DD

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GS8160F36BT-5.5V Summary of contents

Page 1

TQFP Commercial Temp Industrial Temp Features • Flow Through mode operation; Pin Connect • 1 2.5 V core power supply • 1 2.5 V I/O supply • LBO pin for Linear or ...

Page 2

DDQ ...

Page 3

DDQ ...

Page 4

... DQP Rev: 1.01 5/2006 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. GS8160F36BT-xxxV 100-Pin TQFP Pinout 512K x 36 Top View 4/21 Preliminary GS8160FxxBT-xxxV DQP ...

Page 5

TQFP Pin Description Symbol Type I — ...

Page 6

Register A0– LBO ADV CK ADSC ADSP Power Down ZZ Control Note: Only x36 version shown for simplicity. ...

Page 7

Mode Pin Functions Mode Name Burst Order Control Power Down Control Note: There is a pull-down device on the ZZ pin, so this input pin can be unconnected and the chip will operate in the default states as specified in ...

Page 8

Byte Write Truth Table Function GW Read H Read H Write byte a H Write byte b H Write byte c H Write byte d H Write all bytes H Write all bytes L Notes: 1. All byte outputs are ...

Page 9

Synchronous Truth Table Address Operation Used Deselect Cycle, Power Down Deselect Cycle, Power Down Deselect Cycle, Power Down Read Cycle, Begin Burst External Read Cycle, Begin Burst External Write Cycle, Begin Burst External Read Cycle, Continue Burst Read Cycle, Continue ...

Page 10

Notes: 1. The diagram shows only supported (tested) synchronous state transitions. The diagram presumes G is tied low. 2. The upper portion of the diagram assumes active use of only the Enable (E1, E2, and E3) and Write (B trol ...

Page 11

Notes: 1. The diagram shows supported (tested) synchronous state transitions plus supported transitions that depend upon the use Use of “Dummy Reads” (Read Cycles with G High) may be used to make the transition from read cycles ...

Page 12

Absolute Maximum Ratings (All voltages reference Symbol Voltage on V DDQ V I/O V Voltage on Other Input Pins IN I Input Current on Any Pin IN I Output Current on Any I/O ...

Page 13

V & V Range Logic Levels DDQ2 DDQ1 Parameter V Input High Voltage DD V Input Low Voltage DD Notes: 1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifica- tions ...

Page 14

AC Test Conditions Parameter Input high level Input low level Input slew rate Input reference level Output reference level Output load Notes: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. ...

Page 15

Operating Currents Parameter Test Conditions Device Selected; All other inputs Operating ≥V or ≤ V Current IH IL Output open Standby ZZ ≥ V – 0 Current Device Deselected; Deselect All other inputs Current ≥ ≤ ...

Page 16

Begin Read A Cont tKH tKH CK ADSP tS tH ADSC tS tH ADV tS tH A0– Ba– and E3 only sampled with ADSC tOE ...

Page 17

Sleep Mode During normal operation, ZZ must be pulled low, either by the user or by its internal pull down resistor. When ZZ is pulled high, the SRAM will enter a Power Sleep mode after 2 cycles. At this time, ...

Page 18

TQFP Package Drawing (Package T) Symbol Description Min. Nom. Max A1 Standoff 0.05 A2 Body Thickness 1.35 b Lead Width 0.20 c Lead Thickness 0.09 D Terminal Dimension 21.9 D1 Package Body 19.9 E Terminal Dimension 15.9 E1 Package Body ...

Page 19

... Part Number GS8160F18BT-5. GS8160F18BT-6. GS8160F18BT-7.5V 512K x 32 GS8160F32BT-5.5V 512K x 32 GS8160F32BT-6.5V 512K x 32 GS8160F32BT-7.5V 512K x 36 GS8160F36BT-5.5V 512K x 36 GS8160F36BT-6.5V 512K x 36 GS8160F36BT-7. GS8160F18BT-5.5IV GS8160F18BT-6.5IV GS8160F18BT-7.5IV 512K x 32 GS8160F32BT-5.5IV 512K x 32 GS8160F32BT-6 ...

Page 20

Ordering Information for GSI Synchronous Burst RAMs (Continued) 1 Org Part Number 512K x 36 GS8160F36BGT-5.5V 512K x 36 GS8160F36BGT-6.5V 512K x 36 GS8160F36BGT-7. GS8160F18BGT-5.5IV GS8160F18BGT-6.5IV GS8160F18BGT-7.5IV 512K x 32 GS8160F32BGT-5.5IV ...

Page 21

Sync SRAM Datasheet Revision History DS/DateRev. Code: Old; New GS8160FVxxB_r1 GS8160FVxxB_r1; GS8160FxxB-xxxV_r_01 Rev: 1.01 5/2006 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Types of Changes Format or Content • Creation of new datasheet ...

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