GS8160Z18BT-200V GSI [GSI Technology], GS8160Z18BT-200V Datasheet

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GS8160Z18BT-200V

Manufacturer Part Number
GS8160Z18BT-200V
Description
18Mb Pipelined and Flow Through Synchronous NBT SRAM
Manufacturer
GSI [GSI Technology]
Datasheet
100-Pin TQFP
Commercial Temp
Industrial Temp
Features
• NBT (No Bus Turn Around) functionality allows zero wait
• 1.8 V or 2.5 V core power supply
• 1.8 V or 2.5 V I/O supply
• User-configurable Pipeline and Flow Through mode
• LBO pin for Linear or Interleave Burst mode
• Pin compatible with 2M, 4M, and 8M devices
• Byte write operation (9-bit Bytes)
• 3 chip enable signals for easy depth expansion
• ZZ Pin for automatic power-down
• JEDEC-standard 100-lead TQFP package
• RoHS-compliant 100-lead TQFP package available
Functional Description
The GS8160ZxxBT-xxxV is an 18Mbit Synchronous Static
SRAM. GSI's NBT SRAMs, like ZBT, NtRAM, NoBL or
other pipelined read/double late write or flow through read/
single late write SRAMs, allow utilization of all available bus
bandwidth by eliminating the need to insert deselect cycles
when the device is switched from read to write cycles.
Rev: 1.01 5/2006
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
read-write-read bus utilization; Fully pin-compatible with
both pipelined and flow through NtRAM™, NoBL™ and
ZBT™ SRAMs
Flow Through
Pipeline
3-1-1-1
2-1-1-1
18Mb Pipelined and Flow Through
Synchronous NBT SRAM
Curr
Curr
Curr
Curr
tCycle
tCycle
Parameter Synopsis
t
(x32/x36)
t
(x32/x36)
KQ
KQ
(x18)
(x18)
1/22
Because it is a synchronous device, address, data inputs, and
read/ write control inputs are captured on the rising edge of the
input clock. Burst order control (LBO) must be tied to a power
rail for proper operation. Asynchronous inputs include the
Sleep mode enable (ZZ) and Output Enable. Output Enable can
be used to override the synchronous control of the output
drivers and turn the RAM's output drivers off at any time.
Write cycles are internally self-timed and initiated by the rising
edge of the clock input. This feature eliminates complex off-
chip write pulse generation required by asynchronous SRAMs
and simplifies input signal timing.
The GS8160ZxxBT-xxxV may be configured by the user to
operate in Pipeline or Flow Through mode. Operating as a
pipelined synchronous device, meaning that in addition to the
rising edge triggered registers that capture input signals, the
device incorporates a rising-edge-triggered output register. For
read cycles, pipelined SRAM output data is temporarily stored
by the edge triggered output register during the access cycle
and then released to the output drivers at the next rising edge of
clock.
The GS8160ZxxBT-xxxV is implemented with GSI's high
performance CMOS technology and is available in a JEDEC-
standard 100-pin TQFP package.
-250
280
330
210
240
3.0
4.0
5.5
5.5
-200
230
270
185
205
3.0
5.0
6.5
6.5
-150
185
210
170
190
3.8
6.7
7.5
7.5
Unit
mA
mA
mA
mA
ns
ns
ns
ns
GS8160ZxxBT-xxxV
© 2004, GSI Technology
250 MHz–150 MHz
1.8 V or 2.5 V V
1.8 V or 2.5 V I/O
Preliminary
DD

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GS8160Z18BT-200V Summary of contents

Page 1

Pipelined and Flow Through 100-Pin TQFP Commercial Temp Industrial Temp Features • NBT (No Bus Turn Around) functionality allows zero wait read-write-read bus utilization; Fully pin-compatible with both pipelined and flow through NtRAM™, NoBL™ and ZBT™ SRAMs • 1.8 ...

Page 2

... DDQ Rev: 1.01 5/2006 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. GS8160Z18BT-xxxV Pinout Top View 2/22 Preliminary GS8160ZxxBT-xxxV ...

Page 3

DQP DDQ ...

Page 4

TQFP Pin Descriptions Symbol Type ...

Page 5

GS8160V18/36BT-xxxV NBT SRAM Functional Block Diagram Rev: 1.01 5/2006 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Amps Sense Drivers Write 5/22 Preliminary GS8160ZxxBT-xxxV © 2004, GSI Technology ...

Page 6

Functional Details Clocking Deassertion of the Clock Enable (CKE) input blocks the Clock input from reaching the RAM's internal circuits. It may be used to suspend RAM operations. Failure to observe Clock Enable set-up or hold requirements will result in ...

Page 7

Synchronous Truth Table Operation Type Address CK CKE ADV Read Cycle, Begin Burst R Read Cycle, Continue Burst B NOP/Read, Begin Burst R Dummy Read, Continue Burst B Write Cycle, Begin Burst W Write Cycle, Continue Burst ...

Page 8

Pipeline and Flow Through Read Write Control State Diagram New Read R R Burst Read B Key Input Command Code ƒ Transition Current State (n) Next State (n+1) n Clock (CK) Command Current State Current State and Next State Definition ...

Page 9

Intermediate B W High Z (Data In) Key Input Command Code ƒ Transition Current State (n) Intermediate State (N+1) Clock (CK) Command Current State and Next State Definition for Rev: 1.01 5/2006 Specifications cited are subject to change without notice. ...

Page 10

B W High Z (Data In) Key Input Command Code ƒ Transition Current State (n) Clock (CK) Command Current State and Next State Definition for: Rev: 1.01 5/2006 Specifications cited are subject to change without notice. For latest documentation see ...

Page 11

Burst Cycles Although NBT RAMs are designed to sustain 100% bus bandwidth by eliminating turnaround cycle when there is transition from read to write, multiple back-to-back reads or writes may also be performed. NBT SRAMs provide an on-chip burst address ...

Page 12

Sleep Mode During normal operation, ZZ must be pulled low, either by the user or by it’s internal pull down resistor. When ZZ is pulled high, the SRAM will enter a Power Sleep mode after 2 cycles. At this time, ...

Page 13

Absolute Maximum Ratings (All voltages reference Symbol Voltage on V DDQ V I/O V Voltage on Other Input Pins IN I Input Current on Any Pin IN I Output Current on Any I/O ...

Page 14

V & V Range Logic Levels DDQ2 DDQ1 Parameter V Input High Voltage DD V Input Low Voltage DD Notes: 1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifica- tions ...

Page 15

AC Test Conditions Parameter Input high level Input low level Input slew rate Input reference level Output reference level Output load Notes: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. ...

Page 16

Operating Currents Parameter Test Conditions Device Selected; All other inputs Operating ≥V or ≤ V Current IH IL Output open Standby ZZ ≥ V – 0 Current Device Deselected; Deselect All other inputs Current ≥ ≤ ...

Page 17

AC Electrical Characteristics Parameter Clock Cycle Time Clock to Output Valid Clock to Output Invalid Pipeline Clock to Output in Low-Z Setup time Hold time Clock Cycle Time Clock to Output Valid Clock to Output Invalid Flow Through Clock to ...

Page 18

Write A Write CKE ADV A0–An DQa–DQd G *Note High(False ...

Page 19

Write A Write CKE ADV A0– D(A) G *Note High(False ...

Page 20

TQFP Package Drawing (Package T) Symbol Description Min. Nom. Max A1 Standoff 0.05 A2 Body Thickness 1.35 b Lead Width 0.20 c Lead Thickness 0.09 D Terminal Dimension 21.9 D1 Package Body 19.9 E Terminal Dimension 15.9 E1 Package Body ...

Page 21

... Ordering Information for GSI Synchronous Burst RAMs 1 Org Part Number GS8160Z18BT-250V GS8160Z18BT-200V GS8160Z18BT-150V 512K x 36 GS8160Z36BT-250V 512K x 36 GS8160Z36BT-200V 512K x 36 GS8160Z36BT-150V GS8160Z18BT-250IV GS8160Z18BT-200IV GS8160Z18BT-150IV 512K x 36 GS8160Z36BT-250IV 512K x 36 GS8160Z36BT-200IV 512K x 36 GS8160Z36BT-150IV ...

Page 22

Sync SRAM Datasheet Revision History DS/DateRev. Code: Old; Types of Changes New Format or Content 8160ZVxxB_r1 8160ZVxxB_r1; 8160ZxxB_V_r_01 Rev: 1.01 5/2006 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Page;Revisions;Reason • Creation of new ...

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