EVAL-ADXL350Z-S Analog Devices, EVAL-ADXL350Z-S Datasheet - Page 3

• Manufacturer Part Number: EVAL-ADXL350Z-S
• Description: Daughter Cards & OEM Boards EB
• Manufacturer: Analog Devices
• Series: ADXL350r

Specifications of EVAL-ADXL350Z-S

• Rohs: yes
• Product: Satellite Boards
• Description/function: 3 axis accelerometer evaluation board
• Interface Type: I2C, SPI
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Operating Supply Voltage: 2 V to 3.6 V
• Factory Pack Quantity: 1
• For Use With: ADXL350

Data Sheet
SPECIFICATIONS
T
specifications are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter
SENSOR INPUT
OUTPUT RESOLUTION
SENSITIVITY
0 g BIAS LEVEL
NOISE PERFORMANCE
OUTPUT DATA RATE AND BANDWIDTH
SELF-TEST
POWER SUPPLY
OPERATING TEMPERATURE RANGE
1
2
3
4
5
Cross-axis sensitivity is defined as coupling between any two axes.
Offset vs. temperature minimum/maximum specifications are guaranteed by characterization and represent a mean ±3σ distribution.
Bandwidth is half the output data rate.
Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the
DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate).
Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms.
For other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).
A
Measurement Range
Nonlinearity
Inter-Axis Alignment Error
Cross-Axis Sensitivity
Sensitivity at X
Scale Factor at X
Sensitivity at X
Scale Factor at X
Sensitivity at X
Scale Factor at X
Sensitivity at X
Scale Factor at X
Sensitivity at X
Scale Factor at X
0 g Output for X
0 g Output for Z
0 g Offset vs. Temperature (X Axis and Y Axis)
0 g Offset vs. Temperature (Z Axis)
Operating Voltage Range (V
Interface Voltage Range (V
Supply Current
Standby Mode Leakage Current
Turn-On Time
All g Ranges
±1 g Range
±2 g Range
±4 g Range
±8 g Range
Sensitivity Change Due to Temperature
Noise (X-Axis and Y-Axis)
Noise (Z-Axis)
Measurement Rate
Output Change in X-Axis
Output Change in Y-Axis
Output Change in Z-Axis
= 25°C, V
4
S
= 2.5 V, V
5
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
, Y
, Y
, Y
, Y
, Y
, Y
3
, Y
, Y
, Y
, Y
, Y
OUT
OUT
OUT
OUT
OUT
OUT
1
OUT
OUT
OUT
OUT
OUT
, Z
, Z
, Z
, Z
, Z
, Z
, Z
, Z
, Z
, Z
DD I/O
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
DD I/O
S
)
= 2.5 V, acceleration = 0 g, and C
)
2
2
Test Conditions
Each axis
User selectable
Percentage of full scale
Each axis
10-bit resolution
Full resolution
Full resolution
Full resolution
Full resolution
Each axis
Any g-range, full resolution
Any g-range, full resolution
±1 g, 10-bit resolution
±1 g, 10-bit resolution
±2 g, 10-bit resolution
±2 g, 10-bit resolution
±4 g, 10-bit resolution
±4 g, 10-bit resolution
±8 g, 10-bit resolution
±8 g, 10-bit resolution
Each axis
100 Hz data rate, full resolution
100 Hz data rate, full resolution
User selectable
Data rate ≥ 100 Hz, 2.0 V ≤ V
Data rate > 100 Hz
Data rate < 10 Hz
Data rate = 3200 Hz
Rev. 0 | Page 3 of 36
IO
= 0.1 μF, unless otherwise noted. All minimum and maximum
S
≤ 3.6 V
Min
473.6
1.80
473.6
1.80
236.8
3.61
118.4
7.22
59.2
14.45
−150
−250
−0.31
−0.49
6.25
0.2
−2.1
0.3
2.0
1.7
−40
Typ
±1, ±2, ±4, ±8
±0.5
±0.1
±3
10
10
11
12
13
512
1.95
512
1.95
256
3.91
128
7.81
64
15.63
±0.01
±50
±75
±0.17
±0.24
1.1
1.7
2.5
1.8
166
45
0.1
1.4
Max
550.4
2.10
550.4
2.10
275.2
4.21
137.6
8.40
68.8
16.80
+150
+250
+0.31
+0.49
3200
2.1
−0.2
3.4
3.6
V
2
+85
S
ADXL350
Unit
g
%
Degrees
%
Bits
Bits
Bits
Bits
Bits
LSB/g
mg/LSB
LSB/g
mg/LSB
LSB/g
mg/LSB
LSB/g
mg/LSB
LSB/g
mg/LSB
%/°C
Mg
Mg
mg/°C
mg/°C
LSB rms
LSB rms
Hz
g
g
g
V
V
µA
µA
µA
ms
o
C