ADT7317ARQ-REEL Analog Devices Inc, ADT7317ARQ-REEL Datasheet - Page 12

• Manufacturer Part Number: ADT7317ARQ-REEL
• Description: IC SENSOR TEMP 10BIT DAC 16QSOP
• Manufacturer: Analog Devices Inc

Specifications of ADT7317ARQ-REEL

• Rohs Status: RoHS non-compliant
• Function: Temp Monitoring System (Sensor)
• Topology: ADC, Comparator, Multiplexer, Register Bank
• Sensor Type: External & Internal
• Sensing Temperature: -40°C ~ 120°C, External Sensor
• Output Type: I²C™, MICROWIRE™, QSPI™, SMBus™, SPI™
• Output Alarm: No
• Output Fan: No
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 120°C
• Mounting Type: Surface Mount
• Package / Case: 16-QSOP

ADT7316/ADT7317/ADT7318
TERMINOLOGY
Relative Accuracy
Relative accuracy or integral nonlinearity (INL) is a measure of
the maximum deviation, in LSBs, from a straight line passing
through the endpoints of the DAC transfer function. Typical
INL vs. code plots can be seen in Figure 10, Figure 11, and
Figure 12.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±0.9 LSB maximum
ensures monotonicity. Typical DAC DNL vs. code plots can be
seen in Figure 13, Figure 14, and Figure 15.
Offset Error
This is a measure of the offset error of the DAC and the output
amplifier (see Figure 2 and Figure 3). It can be negative or
positive. It is expressed as a percentage of the full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the actual DAC transfer characteristic from
the ideal. It is expressed as a percentage of the full-scale range.
Offset Error Drift
This is a measure of the change in offset error with changes
in temperature. It is expressed in ppm of full-scale range/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in ppm of full-scale range/°C.
Long Term Temperature Drift
This is a measure of the change in temperature error with the
passage of time. It is expressed in degrees Celsius. The concept
of long term stability has been used for many years to describe
by what amount an IC’s parameter would shift during its lifetime.
This is a concept that has been typically applied to both voltage
references and monolithic temperature sensors. Unfortunately,
integrated circuits cannot be evaluated at room temperature
(25°C) for 10 years or so to determine this shift. As a result,
manufacturers very typically perform accelerated lifetime
testing of integrated circuits by operating ICs at elevated tem-
peratures (between 125°C and 150°C) over a shorter period of
time (typically between 500 and 1000 hours). As a result of this
operation, the lifetime of an integrated circuit is significantly
accelerated due to the increase in rates of reaction within the
semiconductor material.
DC Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
in decibels. V
DD
REF
for full-scale output of the DAC. It is measured
is held at 2 V and V
DD
is varied ±10%.
OUT
Rev. B | Page 12 of 44
to
DC Crosstalk
This is the dc change in the output level of one DAC in response
to a change in the output of another DAC. It is measured with a
full-scale output change on one DAC while monitoring another
DAC. It is expressed in microvolts.
Reference Feedthrough
This is the ratio of the amplitude of the signal at the DAC output to
the reference input when the DAC output is not being updated
(that is, LDAC is high). It is expressed in decibels.
Channel-to-Channel Isolation
This is the ratio of the amplitude of the signal at the output of
one DAC to a sine wave on the reference input of another DAC.
It is measured in decibels.
Major-Code Transition Glitch Energy
Major-code transition glitch energy is the energy of the impulse
injected into the analog output when the code in the DAC register
changes state. It is normally specified as the area of the glitch in
nV-s and is measured when the digital code is changed by 1 LSB
at the major carry transition (011…11 to 100…00 or 100...00 to
011…11).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device but is measured when the DAC is not being written to. It
is specified in nV-s and is measured with a full-scale change on
the digital input pins, that is, from all 0s to all 1s or vice versa.
Digital Crosstalk
This is the glitch impulse transferred to the output of one DAC
at midscale in response to a full-scale code change (all 0s to all
1s and vice versa) in the input register of another DAC. It is
measured in standalone mode and is expressed in nV-s.
Analog Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a change in the output of another DAC. It is measured by
loading one of the input registers with a full-scale code change
(all 0s to all 1s and vice versa) while keeping LDAC high. Pulse
LDAC low and monitor the output of the DAC whose digital
code was not changed. The area of the glitch is expressed
in nV-s.
DAC-to-DAC Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a digital code change and subsequent output change of
another DAC. This includes both digital and analog crosstalk.
It is measured by loading one of the DACs with a full-scale
code change (all 0s to all 1s and vice versa) with LDAC low
and monitoring the output of another DAC. The energy of
the glitch is expressed in nV-s.