TLP351(F) Toshiba, TLP351(F) Datasheet - Page 62

• Manufacturer Part Number: TLP351(F)
• Description: IC PHOTOCOUPLER IRED 8-DIP
• Manufacturer: Toshiba

Specifications of TLP351(F)

• Voltage - Isolation: 3750Vrms
• Number Of Channels: 1, Unidirectional
• Current - Output / Channel: 600mA
• Current - Dc Forward (if): 20mA
• Input Type: DC
• Output Type: Push-Pull, Totem-Pole
• Mounting Type: Through Hole
• Package / Case: 8-DIP (0.300", 7.62mm)
• Configuration: 1 Channel
• Maximum Forward Diode Voltage: 1.7 V
• Maximum Reverse Diode Voltage: 5 V
• Maximum Input Diode Current: 10 mA
• Maximum Operating Temperature: + 100 C
• Minimum Operating Temperature: - 40 C
• Isolation Voltage: 3750 Vrms
• Maximum Continuous Output Current: 0.6 A
• Maximum Fall Time: 50 ns
• Maximum Forward Diode Current: 20 mA
• Maximum Rise Time: 50 ns
• Minimum Forward Diode Voltage: 1.55 V
• Output Device: Totem Pole
• No. Of Channels: 1
• Optocoupler Output Type: Gate Drive
• Input Current: 10mA
• Output Voltage: 35V
• Opto Case Style: DIP
• No. Of Pins: 8
• Operating Temperature Range: -40°C To
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: TLP351; TLP351; TLP351F

9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
3
3
10000000
1000000
GaA As (DH) LED Projected Light Output Degradation Data
GaA As (DH) LED Projected Operating Life Data
140
120
100
140
120
100
Device Degradation
100000
80
60
40
20
80
60
40
20
10000
0
0
1000
1
1
100
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
F
F
F
F
F
150
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
Test conditions: I
Test conditions: I
100
85
3.0
60
100
100
Test time (h)
Test time (h)
F
F
25
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
1000
1000
0
4.0
I
F
Ambient Temperature (°C)
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F50%
operating life
10000
10000
Projected F0.1%
operating life
X-3σ
–50
X-3σ
1 / K(×10
X
X
100000
100000
–73
5.0
−3
)
62
10000000
1000000
140
120
100
100000
80
60
40
20
10000
0
1000
100
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
Test conditions: I
100
85
3.0
60
100
Test time (h)
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
Ambient Temperature (°C)
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
X
1 / K(×10
100000
–73
5.0
−3
)