TC58V64BDC Toshiba, TC58V64BDC Datasheet - Page 31

• Manufacturer Part Number: TC58V64BDC
• Description: IC 64MBIT NAND FLASH 3V 44-TSOP
• Manufacturer: Toshiba

Specifications of TC58V64BDC

• Memory Size: 8MB
• Memory Type: EEPROM - Smart Media
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

(13)
(14)
(15)
(16)
Invalid blocks (bad blocks)
Failure phenomena for Program and Erase operations
·
·
Chattering of Connector
This chattering may cause damage to the data in the device. Therefore, sufficient time must be allowed for
contact bouncing to subside when a system is designed with SmartMedia
The device is formatted to comply with the Physical and Logical Data Format of the SSFDC Forum at the
Block
Page
Single Bit
time of shipping.
The device contains unusable blocks. Therefore, the following issues must be recognized:
The device may fail during a Program or Erase operation.
The following possible failure modes should be considered when implementing a highly reliable system.
There may be contact chattering when the device is inserted or removed from a connector.
ECC: Error Correction Code
Block Replacement
Program
Erase
creating a table within the system or by using another appropriate scheme).
Figure 26.
When an error occurs for an Erase operation, prevent future accesses to this bad block (again by
memory
Buffer
FAILURE MODE
Erase Failure
Programming Failure
Programming Failure
1 ® 0
Error occurs
Bad Block
Bad Block
Figure 27.
system to detect bad blocks in the accordance with the physical data
format issued by the SSFDC Forum. Detect the bad blocks by checking the
Block Status Area at the system power-on, and do not access the bad
blocks in the following routine.
Valid (Good) Block Number
Referring to the Block status area in the redundant area allows the
The number of valid blocks at the time of shipment is as follows:
Status Read after Erase ® Block Replacement
Status Read after Program ® Block Replacement
(1) Block Verify after Program ® Retry
(2) ECC
Block A
Block B
DETECTION AND COUNTERMEASURE SEQUENCE
reprogram the data into another (Block B) by
loading from an external buffer. Then, prevent
further system accesses to Block A (by creating
a bad block table or by using an another
appropriate scheme).
When an error happens in Block A, try to
1014
MIN
TM
TYP.
.
¾
2001-10-24 31/33
TC58V64BDC
MAX
1024
Block
UNIT