PXAG30KBBD,157 NXP Semiconductors, PXAG30KBBD,157 Datasheet - Page 30

IC XA MCU 16BIT ROMLESS 44-LQFP

PXAG30KBBD,157

Manufacturer Part Number
PXAG30KBBD,157
Description
IC XA MCU 16BIT ROMLESS 44-LQFP
Manufacturer
NXP Semiconductors
Series
XAr
Datasheet

Specifications of PXAG30KBBD,157

Program Memory Type
ROMless
Package / Case
44-LQFP
Core Processor
XA
Core Size
16-Bit
Speed
30MHz
Connectivity
UART/USART
Peripherals
PWM, WDT
Number Of I /o
32
Ram Size
512 x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Oscillator Type
External
Operating Temperature
0°C ~ 70°C
Processor Series
PXAG3x
Core
80C51
Data Bus Width
16 bit
Data Ram Size
512 B
Interface Type
UART
Maximum Clock Frequency
30 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 70 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
0 C
Cpu Family
XA
Device Core
80C51
Device Core Size
16b
Frequency (max)
30MHz
Program Memory Size
Not Required
Total Internal Ram Size
512Byte
# I/os (max)
32
Number Of Timers - General Purpose
3
Operating Supply Voltage (typ)
3.3/5V
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
2.7V
Instruction Set Architecture
CISC
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
44
Package Type
LQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Data Converters
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
568-1300
935270581157
PXAG30KBBD

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
PXAG30KBBD,157
Manufacturer:
NXP Semiconductors
Quantity:
10 000
Philips Semiconductors
2002 Mar 25
XA 16-bit microcontroller family
512 B RAM, watchdog, 2 UARTs
CLOCK SIGNAL
Figure 25. I
(NC)
All other pins are disconnected
DD
RST
XTAL2
XTAL1
V
SS
Test Condition, Active Mode
V
NOTE:
For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs,
and begins to float when a 100mV change from the loaded V
LOAD
AC inputs during testing are driven at V
NOTE:
Timing measurements are made at the 50% point of transitions.
V
DD
0.45V
V
V
V
–0.5
LOAD
LOAD
DD
0.45V
V
–0.5
EA
DD
SU00591B
–0.1V
+0.1V
V
Figure 23. AC Testing Input/Output
DD
Figure 22. External Clock Drive
Figure 24. Float Waveform
0.2V
t
CHCL
0.7V
DD
DD
0.2V
0.2V
–0.1
DD
REFERENCE
DD
DD
–0.5 for a logic ‘1’ and 0.45V for a logic ‘0’.
TIMING
POINTS
+0.9
–0.1
28
t
CLCX
CLOCK SIGNAL
OH
/V
t
C
OL
t
CHCX
level occurs. I
t
CLCH
Figure 26. I
(NC)
V
V
SU00842
All other pins are disconnected
OH
OL
V
SU00703A
+0.1V
OH
DD
–0.1V
/I
OL
DD
RST
XTAL2
XTAL1
V
SU00011
SS
20mA.
Test Condition, Idle Mode
V
EA
DD
SU00590B
XA-G30
V
DD
Product data

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