ST72F324BJ6B6 STMicroelectronics, ST72F324BJ6B6 Datasheet - Page 156
ST72F324BJ6B6
Manufacturer Part Number
ST72F324BJ6B6
Description
MCU 8BIT 32KB FLASH/ROM 42-SDIP
Manufacturer
STMicroelectronics
Series
ST7r
Datasheet
1.ST72F324BJ6B6.pdf
(193 pages)
Specifications of ST72F324BJ6B6
Core Processor
ST7
Core Size
8-Bit
Speed
8MHz
Connectivity
SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
3.8 V ~ 5.5 V
Data Converters
A/D 12x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
42-SDIP (0.600", 15.24mm)
Controller Family/series
ST7
No. Of I/o's
32
Ram Memory Size
1KB
Cpu Speed
8MHz
No. Of Timers
2
Embedded Interface Type
SCI, SPI
No. Of Pwm Channels
3
Processor Series
ST72F3x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
Development Tools By Supplier
ST7232X-EVAL, ST7MDT20-DVP3, ST7MDT20J-EMU3, STX-RLINK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 12 Channel
For Use With
497-6421 - BOARD EVAL DGTL BATT CHGR DESIGN497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Other names
497-5589-5
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Electrical characteristics
Table 102. EMS test results
12.8.2
Table 103. EMI emissions
1. Refer to application note AN1709 for data on other package types.
2. Not tested in production.
156/193
Symbol Parameter
Symbol
S
V
V
EMI
FESD
FFTB
Peak level
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Fast transient voltage burst limits to be
applied through 100 pF on V
pins to induce a functional disturbance
Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling two LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
(2)
V
T
conforming to
SAE J 1752/3
A
Conditions
DD
= +25 °C
Parameter
= 5 V
8/16 Kbyte Flash
LQFP32 and LQFP44
32 Kbyte Flash
LQFP32 and LQFP44
8/16 Kbyte ROM
LQFP32 and LQFP44
32 Kbyte ROM
LQFP32 and LQFP44
DD
Device/package
and V
DD
32 Kbyte Flash or ROM device:
V
conforms to IEC 1000-4-2
8 or 16 Kbyte ROM device:
V
conforms to IEC 1000-4-2
8 or 16 Kbyte Flash device:
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
(1)
DD
DD
DD
DD
= 5 V, T
= 5 V, T
= 5 V, T
= 5 V, T
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
frequency band
Monitored
A
A
A
A
= +25 °C, f
= +25°C, f
= +25 °C, f
= +25 °C, f
Conditions
OSC
OSC
OSC
OSC
= 8 MHz
8/4 MHz
= 8 MHz
= 8 MHz
Max vs [f
= 8 MHz
3.0
3.0
3.0
12
19
15
13
20
16
12
23
15
17
24
18
3
OSC
16/8 MHz
/f
ST72324Bxx
3.5
3.5
3.5
3.5
Level/class
18
25
22
14
25
21
15
26
20
21
30
23
CPU
]
3B
4A
4B
4A
dBµV
dBµV
dBµV
dBµV
Unit
-
-
-
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