MC9S12XET256MAL Freescale Semiconductor, MC9S12XET256MAL Datasheet - Page 1044

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MC9S12XET256MAL

Manufacturer Part Number
MC9S12XET256MAL
Description
MCU 16BIT 256K FLASH 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheet

Specifications of MC9S12XET256MAL

Core Processor
HCS12X
Core Size
16-Bit
Speed
50MHz
Connectivity
CAN, EBI/EMI, I²C, IrDA, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
91
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
16K x 8
Voltage - Supply (vcc/vdd)
1.72 V ~ 5.5 V
Data Converters
A/D 12x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 125°C
Package / Case
112-LQFP
Cpu Family
HCS12X
Device Core Size
16b
Frequency (max)
50MHz
Interface Type
CAN/SCI/SPI
Total Internal Ram Size
16KB
# I/os (max)
91
Number Of Timers - General Purpose
25
Operating Supply Voltage (typ)
1.8/2.8/5V
Operating Supply Voltage (max)
1.98/2.9/5.5V
Operating Supply Voltage (min)
1.72/2.7/3.13V
On-chip Adc
16-chx12-bit
Instruction Set Architecture
RISC
Operating Temp Range
-40C to 125C
Operating Temperature Classification
Automotive
Mounting
Surface Mount
Pin Count
112
Package Type
LQFP
No. Of I/o's
91
Eeprom Memory Size
4KB
Ram Memory Size
16KB
Cpu Speed
50MHz
No. Of Timers
3
No. Of Pwm Channels
8
Digital Ic Case Style
LQFP
Rohs Compliant
Yes
Processor Series
S12XE
Core
HCS12
Data Bus Width
16 bit
Data Ram Size
16 KB
Maximum Clock Frequency
50 MHz
Number Of Programmable I/os
91
Number Of Timers
25
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWHCS12
Development Tools By Supplier
KIT33812ECUEVME, EVB9S12XEP100, DEMO9S12XEP100
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Chapter 27 512 KByte Flash Module (S12XFTM512K3V1)
27.3.2.12 EEE Tag Counter Register (ETAG)
The ETAG register contains the number of outstanding words in the buffer RAM EEE partition that need
to be programmed into the D-Flash EEE partition. The ETAG register is decremented prior to the related
tagged word being programmed into the D-Flash EEE partition. All tagged words have been programmed
into the D-Flash EEE partition once all bits in the ETAG register read 0 and the MGBUSY flag in the
FSTAT register reads 0.
All ETAG bits are readable but not writable and are cleared by the Memory Controller.
27.3.2.13 Flash ECC Error Results Register (FECCR)
The FECCR registers contain the result of a detected ECC fault for both single bit and double bit faults.
The FECCR register provides access to several ECC related fields as defined by the ECCRIX index bits
in the FECCRIX register (see
1044
Offset Module Base + 0x000C
Offset Module Base + 0x000D
Reset
Reset
W
W
R
R
0
0
7
7
CCOBIX[2:0]
= Unimplemented or Reserved
= Unimplemented or Reserved
011
100
101
Table 27-26. FCCOB - NVM Command Mode (Typical Usage)
Figure 27-19. EEE Tag Counter Low Register (ETAGLO)
Figure 27-18. EEE Tag Counter High Register (ETAGHI)
0
0
6
6
Section
MC9S12XE-Family Reference Manual , Rev. 1.23
Byte
LO
LO
LO
HI
HI
HI
0
0
5
5
27.3.2.4). Once ECC fault information has been stored, no other
FCCOB Parameter Fields (NVM Command Mode)
0
0
4
4
ETAG[15:8]
ETAG[7:0]
Data 1 [15:8]
Data 2 [15:8]
Data 3 [15:8]
Data 1 [7:0]
Data 2 [7:0]
Data 3 [7:0]
0
0
3
3
0
0
2
2
Freescale Semiconductor
0
0
1
1
0
0
0
0

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