OPF794 Optek, OPF794 Datasheet - Page 38

• Manufacturer Part Number: OPF794
• Description: Photodiodes Pin Photodiode
• Manufacturer: Optek

Specifications of OPF794

• Maximum Reverse Voltage: 100 V
• Maximum Rise Time: 6 ns
• Mounting Style: SMD/SMT
• Product: Photodiode
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

High-Reliability
GENERIC OPTEK PROCESSING (Continued)
Notes:
1.
2.
3.
4.
5.
6.
7.
8.
Page B—18
Product Definitions
Operation Description
Burn-In
Post Burn-In Testing
PDA Limit
ALL other specified electrical test
Calculate PDA on all tests
X-Ray
External Visual
Produce a Failure Accountability Sheet
Lot Acceptance Testing
Read & Record, and Delta Calculations
Perform 100%
Read & Record
Revision K
OPTEK is a compliant COTS supplier per MIL-STD 750 and MIL-PRF-19500. OPTEK does not claim to be a supplier as defined in MIL-STD-883D,
paragraph 1.2.1. MIL-STD-883 requirements are based on Revision D, Notice 2.
TX products receives only 30X inspection. TXV product receives those magnifications called out in Method 2072.
This temperature or the maximum device rating (whichever is less) will be used.
Hermeticity testing will be performed at this point or after Burn-In electrical test.
Performed routinely on select transistor and diodes only but available on any bi-polar or PN junction device.
European Space Agency (ESA) 5000 Revision D.
The sample sizes given are for lot sizes of 2,500 pieces or less, the definition for “small lot” size per MIL-PRF-19500.
Screening
MIL-PRF-19500
TX & TXV per MIL-
and TXV Group A,
provided for TX
Diodes 96 hrs.,
1038 or 1039
MIL-STD-750
B, C testing
PRF-19500
Transistors
See Table
160 hrs.
Method
Cond. B
10%
No
No
No
No
No
No
MIL-PRF-19500
level Group A, B,
S-Level per MIL-
provided for S
1038 or 1039
MIL-STD-750
PRF-19500
See Table
C testing
Method
Cond. B
240 hrs.
2076
2071
5%
Yes
Yes
No
No
B-Level per M5004
of MIL-STD-883
1015, 160 hrs
Group A, B, C
MIL-STD-883
provided for
See Table
Method
testing
2009
5005
Yes
5%
Yes
No
No
No
No
2
S-Level per M5004
of MIL-STD-883
Issue A.1 2005
OPTEK Technology Inc. www.optekinc.com
1015, 240 hrs
Group A, B, D
MIL-STD-883
provided for
See Table
Method
testing
2012
2009
5005
5%
Yes
No
No
No
2
Group level 1, 2
B-Level per ESA
Diodes 96 hrs.,
1038 or 1039
MIL-STD-750
and 3 testing
provided for
Transistors
ESA 5000
See Table
Method
Cond. B
160 hrs.
5000
2076
2071
5%
Yes
Yes
Yes
Yes
7