OPF794 Optek, OPF794 Datasheet - Page 39

• Manufacturer Part Number: OPF794
• Description: Photodiodes Pin Photodiode
• Manufacturer: Optek

Specifications of OPF794

• Maximum Reverse Voltage: 100 V
• Maximum Rise Time: 6 ns
• Mounting Style: SMD/SMT
• Product: Photodiode
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Issue A.1 2005
OPTEK Technology Inc. www.optekinc.com
High-Reliability
LOT ACCEPTANCE TESTING — MIL-PRF-19500
LOT ACCEPTANCE TESTING
Per MIL-PRF-19500 and MIL-STD-883 Method 5005
Per MIL-PRF-19500, lot acceptance testing is performed by sampling each date code lot following all 100% screening operations
and performing a series of tests. Tests are divided into groups. Group A for electrical, Group B & C for Environmental and life test.
Group A& B is performed on every lot while Group C is performed on one lot for each package and chip combination every 12
months. Standard OPTEK products that have a TX or TXV suffix typically follow the generic MIL-PRF-10500 lot acceptance test
outline and rules. Products with a B or S suffix are usually MIL-STD-883, M5005 controlled. Special circumstances may warrant a
deviation on some products.
The following tables reflect MIL-PRF-19500 Revision M as they affect OPTEK standard products. OPTEK attempts to maintain
standard TX, TXV, S, B & ESA specifications up to the most current revision.
Subgroup 8A
Subgroup 8B
Subgroup 10
Subgroup 11
Subgroup
Subgroup 1
Subgroup 2
Subgroup 3
Subgroup 4
Subgroup 5
Subgroup 6
Subgroup 7
Subgroup 9
High & Low Temp Test
Safe Operating Area
Visual & Mechanical
25°C Dynamic Test
Surge Current
25°C DC Test
Operation
Misc.
N/A
N/A
N/A
N/A
N/A
MIL-PRF-19500 TX, TXV, & S Level
—
Group A
TX & TXV
45
45
45
45
45
22
22
0
0
0
0
0
Sample Quantity
S-Level
116
116
116
8
15
45
45
45
0
0
0
0
0
B & S Level samples size for All Sub-
High Temp Switching Time Test
Low Temp Switching Time Test
MIL-STD-883
High Temp. Functional Test
Low Temp. Functional Test
High Temp. Dynamic Test
25°C Switching Time Test
Low Temp. Dynamic Test
25°C Functional Test
High Temp. DC Test
25 ° C Dynamic Test
Low Temp. DC Test
groups = 116/0
25 ° C DC Test
2
Method 5005
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