MT49H16M18CBM-25 Micron Technology Inc, MT49H16M18CBM-25 Datasheet - Page 14

• Manufacturer Part Number: MT49H16M18CBM-25
• Manufacturer: Micron Technology Inc
• Type: RLDRAMr

Specifications of MT49H16M18CBM-25

• Organization: 16Mx18
• Density: 288Mb
• Address Bus: 23b
• Maximum Clock Rate: 400MHz
• Operating Supply Voltage (typ): 1.8V
• Package Type: uBGA
• Operating Temp Range: 0C to 95C
• Operating Supply Voltage (max): 1.9V
• Operating Supply Voltage (min): 1.7V
• Supply Current: 779mA
• Pin Count: 144
• Mounting: Surface Mount
• Operating Temperature Classification: Commercial
• Lead Free Status / RoHS Status: Compliant

PDF: 09005aef80a41b59/Source: 09005aef811ba111
288Mb_RLDRAM_II_SIO_D2.fm - Rev. P 1/11 EN
3. Input slew rate is specified in Table 8 on page 19.
4. Definitions for I
5. CS# is HIGH unless a READ, WRITE, AREF, or MRS command is registered. CS# never transi-
6. I
7. Tests for AC timing, I
8. I
4b. HIGH is defined as V
4d. Floating is defined as inputs at V
4g. Sequential bank access is defined as the bank address incrementing by one every
4h. Cyclic bank access is defined as the bank address incrementing by one for each com-
4a. LOW is defined as V
4e. Continuous data is defined as half the D or Q signals changing between HIGH and LOW
4c. Stable is defined as inputs remaining at a HIGH or LOW level.
4f. Continuous address is defined as half the address signals changing between HIGH and
tions more than once per clock cycle.
nal reference/supply voltage levels, but the related specifications and device operations are
tested for the full voltage range specified.
is still referenced to V
tested for the specified AC input levels under normal use conditions. The minimum slew
rate for the input signals used to test the device is 2 V/ns in the range between V
V
DD
DD
IH(AC)
every half clock cycle (twice per clock).
LOW every clock cycle (once per clock).
mand access. For BL = 2 this is every clock, for BL = 4 this is every other clock, and for
BL = 8 this is every fourth clock.
parameters are specified with ODT disabled.
tests may use a V
.
DD
288Mb: x18 2.5V V
conditions:
DD
IL
REF
-to-V
, and electrical AC and DC characteristics may be conducted at nomi-
IN
IN
(or to the crossing point for CK/CK#). Parameter specifications are
≤ V
≥ V
IH
14
IL(AC)
IH(AC)
swing of up to 1.5V in the test environment, but input timing
MAX.
MIN.
REF
Micron Technology, Inc., reserves the right to change products or specifications without notice.
= V
EXT
DDQ
, 1.8V V
/2.
Electrical Specifications – I
DD
, HSTL, SIO, RLDRAM II
©2003Micron Technology, Inc. All rights reserved.
IL(AC)
t
RC.
and
DD