AD5381BST-3 Analog Devices Inc, AD5381BST-3 Datasheet - Page 13

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AD5381BST-3

Manufacturer Part Number
AD5381BST-3
Description
IC DAC 12BIT 40CH 3V 100-LQFP
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5381BST-3

Design Resources
40 Channels of Programmable Voltage with Excellent Temperature Drift Performance Using AD5381 (CN0010) AD5381 Channel Monitor Function (CN0013)
Settling Time
6µs
Number Of Bits
12
Data Interface
Serial, Parallel
Number Of Converters
40
Voltage Supply Source
Single Supply
Power Dissipation (max)
80mW
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
100-LQFP
For Use With
EVAL-AD5381EB - BOARD EVAL FOR AD5381
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
ABSOLUTE MAXIMUM RATINGS
T
Table 9.
Parameter
AVDD to AGND
DVDD to DGND
Digital Inputs to DGND
SDA/SCL to DGND
Digital Outputs to DGND
REFIN/REFOUT to AGND
AGND to DGND
VOUTx to AGND
Analog Inputs to AGND
Operating Temperature Range
Commercial (B Version)
Storage Temperature Range
JunctionTemperature (T
100-Lead LQFP Package
θ
Reflow Soldering
Reflow Soldering (Pb-free)
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
this product features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
Transient currents of up to 100 mA will not cause SCR latch-up.
JA
A
Peak Temperature
Peak Temperature
Time at Peak Temperature
Thermal Impedance
= 25°C, unless otherwise noted.
J MAX
)
–0.3 V to +0.3 V
150°C
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to DVDD + 0.3 V
–0.3 V to +7 V
–0.3 V to DVDD + 0.3 V
–0.3 V to AVDD + 0.3 V
–0.3 V to AVDD + 0.3 V
–0.3 V to AVDD + 0.3 V
–40°C to +85°C
–65°C to +150°C
44°C/W
230°C
260(0/-5)°C
10 sec to 40 sec
1
Rev. B | Page 13 of 40
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maxi-
mum rating conditions for extended periods may affect device
reliability.
AD5381

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