AD5381BST-3 Analog Devices Inc, AD5381BST-3 Datasheet - Page 17

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AD5381BST-3

Manufacturer Part Number
AD5381BST-3
Description
IC DAC 12BIT 40CH 3V 100-LQFP
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5381BST-3

Design Resources
40 Channels of Programmable Voltage with Excellent Temperature Drift Performance Using AD5381 (CN0010) AD5381 Channel Monitor Function (CN0013)
Settling Time
6µs
Number Of Bits
12
Data Interface
Serial, Parallel
Number Of Converters
40
Voltage Supply Source
Single Supply
Power Dissipation (max)
80mW
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
100-LQFP
For Use With
EVAL-AD5381EB - BOARD EVAL FOR AD5381
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
TERMINOLOGY
Relative Accuracy
Relative accuracy, or endpoint linearity, is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero-scale error and full-scale error, and is
expressed in LSB.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Zero-Scale Error
Zero-scale error is the error in the DAC output voltage when all
0s are loaded into the DAC register. Ideally, with all 0s loaded
to the DAC and m = all 1s, c = 2
Zero-scale error is a measure of the difference between VOUT
(actual) and VOUT (ideal), expressed in mV. It is mainly due to
offsets in the output amplifier.
Offset Error
Offset error is a measure of the difference between VOUT
(actual) and VOUT (ideal) in the linear region of the transfer
function, expressed in mV. Offset error is measured on the
AD5381-5 with Code 32 loaded into the DAC register, and on
the AD5381-3 with Code 64.
Gain Error
Gain Error is specified in the linear region of the output range
between VOUT = 10 mV and VOUT = AVDD – 50 mV. It is
the deviation in slope of the DAC transfer characteristic from
the ideal and is expressed in %FSR with the DAC output
unloaded.
DC Crosstalk
This is the dc change in the output level of one DAC at
midscale in response to a full-scale code (all 0s to all 1s, and
vice versa) and output change of all other DACs. It is expressed
in LSB.
VOUT
(Zero-Scale)
= 0 V
n – 1
Rev. B | Page 17 of 40
DC Output Impedance
This is the effective output source resistance. It is dominated by
package lead resistance.
Output Voltage Settling Time
This is the amount of time it takes for the output of a DAC to
settle to a specified level for a ¼ to ¾ full-scale input change,
and is measured from the BUSY rising edge.
Digital-to-Analog Glitch Energy
This is the amount of energy injected into the analog output at
the major code transition. It is specified as the area of the glitch
in nV-s. It is measured by toggling the DAC register data
between 0x7FF and 0x800.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse that appears at the
output of one DAC due to both the digital change and the
subsequent analog output change at another DAC. The victim
channel is loaded with midscale. DAC-to-DAC crosstalk is
specified in nV-s.
Digital Crosstalk
The glitch impulse transferred to the output of one converter
due to a change in the DAC register code of another converter
is defined as the digital crosstalk and is specified in nV-s.
Digital Feedthrough
When the device is not selected, high frequency logic activity
on the device’s digital inputs can be capacitively coupled both
across and through the device to show up as noise on the
VOUT pins. It can also be coupled along the supply and
ground lines. This noise is digital feedthrough.
Output Noise Spectral Density
This is a measure of internally generated random noise.
Random noise is characterized as a spectral density (voltage per
√Hertz). It is measured by loading all DACs to midscale and
measuring noise at the output. It is measured in nV/√Hz in a
1 Hz bandwidth at 10 kHz.
AD5381

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